EN 60749-34:2004

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34: Lastwechselprüfung

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 34: Cycles en puissance

Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004)

General Information

• Status: Withdrawn
• Publication Date: 15-Apr-2004
• Withdrawal Date: 31-Mar-2007
• ICS: 31.080 - Semiconductor devices
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Parallel Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 9960 - Withdrawal effective - Withdrawal
• Start Date: 01-Dec-2013
• Completion Date: 01-Dec-2013
• Ref Project: SIST EN 60749-34:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

Relations

• Replaced By: EN 60749-34:2010 - Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
• Effective Date: 28-Jan-2023

Standards Content (Sample)

SLOVENSKI SIST EN 60749-34:2004

STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power
cycling (IEC 60749-34:2004)
ICS 31.080.01 Referenčna številka
SIST EN 60749-34:2004(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 60749-34
NORME EUROPÉENNE
EUROPÄISCHE NORM April 2004

ICS 31.080


English version


Semiconductor devices –
Mechanical and climatic test methods
Part 34: Power cycling
(IEC 60749-34:2004)


Dispositifs à semiconducteurs –  Halbleiterbauelemente –
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 34 : Cycles en puissance Teil 34: Lastwechselprüfung
(CEI 60749-34:2004) (IEC 60749-34:2004)






This European Standard was approved by CENELEC on 2004-04-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60749-34:2004 E

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EN 60749-34:2004 - 2 -
Foreword
The text of document 47/1738/FDIS, future edition 1 of IEC 60749-34, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-34 on 2004-04-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2007-04-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-34:2004 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 60749-34:2004
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60747 Series Semiconductor devices – Discrete EN 60747 Series
devices and intergrated circuits

1)
IEC 60747-1 - Part 1: General - -

1)
IEC 60747-2 - Part 2: Rectifier diodes - -

1)
IEC 60747-6 - Part 6: Thyristors - -

IEC 60748 Series Semiconductor devices - Integrated - -
circuits

1)
2)
IEC 60749-3 - Semiconductor devices - Mechanical and EN 60749-3 2002
climatic test methods
Part 3: External visual examination

1) 2)
IEC 60749-23 - Part 23: High temperature operating life EN 60749-23 2004





1)
Undated reference.
2)
Valid edition at date of issue.

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