EN 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 43: Leitfaden Pläne zur Zuverlässigkeitsqualifikation von integrierten Schaltungen

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Lignes directrices concernant les plans de qualification de la fiabilité des CI

L’IEC 60749-43:2017 fournit des lignes directrices concernant les plans de qualification de la fiabilité des produits de circuits intégrés (CI) à semiconducteurs. Le présent document n’est pas destiné aux applications militaires et spatiales.

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 43. del: Smernice za načrtovanje ocenjevanja zanesljivosti integriranih vezij (IEC 60749-43:2017)

Ta del standarda IEC 60749 podaja smernice za načrtovanje ocenjevanja zanesljivosti polprevodniških integriranih vezij (IC). Ta dokument ni namenjen za vojaško uporabo in uporabo v vesolju.
OPOMBA 1: Proizvajalec lahko uporablja vzorce različnih velikosti, da zmanjša stroške in ohrani razumno zanesljivost skladno s to prilagoditvijo smernic, ki temelji na dokumentih EDR-4708, AEC Q100, JESD47 ali drugih ustreznih dokumentih, ki se lahko uporabijo, če so navedeni.
OPOMBA 2: Metoda z Weibullovo porazdelitvijo, ki se uporablja v tem dokumentu, je ena izmed številnih metod za izračun primerne velikosti vzorca in preskusnih pogojev za dano ocenjevanje zanesljivosti.

General Information

• Status: Published
• Publication Date: 31-Aug-2017
• Withdrawal Date: 19-Jul-2020
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 01-Sep-2017
• Completion Date: 01-Sep-2017
• Ref Project: SIST EN 60749-43:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017)

Relations

• Replaced By: EN IEC 63287-1:2021 - Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
• Effective Date: 16-Nov-2021

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60749-43:2017
01-november-2017
3ROSUHYRGQLãNLHOHPHQWL0HKDQVNHLQNOLPDWVNHSUHVNXVQHPHWRGHGHO
6PHUQLFH]DQDþUWRYDQMHRFHQMHYDQMD]DQHVOMLYRVWLLQWHJULUDQLKYH]LM,(&

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for
IC reliability qualification plans (IEC 60749-43:2017)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie
43: Directives concernant les plans de qualification de la fiabilité des CI (IEC 60749-
43:2017)
Ta slovenski standard je istoveten z: EN 60749-43:2017
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
SIST EN 60749-43:2017 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60749-43:2017

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SIST EN 60749-43:2017


EUROPEAN STANDARD EN 60749-43

NORME EUROPÉENNE

EUROPÄISCHE NORM
September 2017
ICS 31.080.01

English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 43: Guidelines for IC reliability qualification plans
(IEC 60749-43:2017)
Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische
mécaniques et climatiques - Partie 43: Lignes directrices Prüfverfahren - Teil 43: Leitfaden Pläne zur
concernant les plans de qualification de la fiabilité des CI Zuverlässigkeitsqualifikation von integrierten Schaltungen
(IEC 60749-43:2017) (IEC 60749-43:2017)
This European Standard was approved by CENELEC on 2017-07-20. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.



European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN 60749-43:2017 E

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SIST EN 60749-43:2017
EN 60749-43:2017
European foreword
The text of document 47/2389/FDIS, future edition 1 of IEC 60749-43, prepared by
IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved
by CENELEC as EN 60749-43:2017.

The following dates are fixed:
(dop) 2018-04-20
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-07-20
standards conflicting with the
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 60749-43:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 60068-2-1 NOTE Harmonized as EN 60068-2-1.
IEC 60068-2-30 NOTE Harmonized as EN 60068-2-30.
IEC 60749-11 NOTE Harmonized as EN 60749-11.

2

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SIST EN 60749-43:2017
EN 60749-43:2017

Annexe ZA
(normative)
Références normatives à d'autres publications internationales
avec les publications européennes correspondantes
Les documents suivants, en tout ou en partie, sont référencés normativement dans le présent
document et sont indispensables pour son application. Pour les références datées, seule l'édition citée
s'applique
...