Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 2: Schädigungsmechanismen

Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 2: Mécanismes de détérioration

L’IEC 62435-2:2017 a trait aux mécanismes de détérioration et traite de la façon dont les composants se dégradent dans le temps en fonction des conditions de stockage appliquées. La présente partie contient aussi des préconisations sur les méthodes d’essai qui peuvent être utilisées pour évaluer les mécanismes de détérioration génériques. Elle s’utilise habituellement conjointement avec l’IEC 62435-1:2017 pour tout stockage de dispositifs dont la durée peut être supérieure à 12 mois, pour un produit destiné à être stocké pendant une durée prolongée.

Elektronske komponente - Dolgoročno skladiščenje elektronskih polprevodniških elementov - 2. del: Mehanizmi slabšanja (IEC 62435-2:2017)

Ta del standarda IEC 62435 je povezan z mehanizmi slabšanja in obravnava način, na katerega se komponente razgrajujejo v času življenjske dobe glede na uporabljene pogoje skladiščenja. Ta del vključuje tudi navodila o preskusnih metodah, ki se lahko uporabljajo za ocenjevanje splošnih mehanizmov slabšanja. Običajno se ta del uporablja skupaj s standardom IEC 62435-1 za dolgoročno skladiščenje poljubne naprave, ki je lahko daljše od 12 mesecev za izdelek, ki je načrtovan za dolgoročno skladiščenje. Mehanizmi, ki se uporabljajo za posebne vrste komponent, so opisani v standardih od IEC 62435-5 do IEC 62435-9 (predlog)1.

General Information

Status
Published
Publication Date
27-Apr-2017
Withdrawal Date
27-Feb-2020
Drafting Committee
Current Stage
6060 - Document made available - Publishing
Start Date
28-Apr-2017
Completion Date
28-Apr-2017

Buy Standard

Standard
EN 62435-2:2017
English language
21 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.SUHYRGQLãNLKComposants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 2 - Mécanismes de détérioration (IEC 62435-2:2017)Electronic components - Long-term storage of electronic semiconductor devices - Part 2 - Deterioration Mechanisms (IEC 62435-2:2017)31.080.01Polprevodniški elementi (naprave) na splošnoSemiconductor devices in generalICS:Ta slovenski standard je istoveten z:EN 62435-2:2017SIST EN 62435-2:2017en01-junij-2017SIST EN 62435-2:2017SLOVENSKI
STANDARD



SIST EN 62435-2:2017



EUROPEAN STANDARD NORME EUROPÉENNE EUROPÄISCHE NORM
EN 62435-2
April 2017 ICS 31.020
English Version
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017)
Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs -
Partie 2: Mécanismes de détérioration (IEC 62435-2:2017)
Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 2: Schädigungsmechanismen (IEC 62435-2:2017) This European Standard was approved by CENELEC on 2017-02-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17,
B-1000 Brussels © 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62435-2:2017 E SIST EN 62435-2:2017



EN 62435-2:2017 2 European foreword The text of document 47/2327/FDIS, future edition 1 of IEC 62435-2, prepared by IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62435-2:2017. The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2017-11-28 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-02-28
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62435-2:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60068-2-17:1994 NOTE Harmonized as EN 60068-2-17:1994 (not modified). IEC 60068-2-20:2008 NOTE Harmonized as EN 60068-2-20:2008 (not modified). IEC 60721-3-1 NOTE Harmonized as EN 60721-3-1. IEC 60721-3-3 NOTE Harmonized as EN 60721-3-3. IEC 60749-21 NOTE Harmonized as EN 60749-21. IEC 61340-5-1:2007 NOTE Harmonized as EN 61340-5-1:2007 (not modified). IEC/TR 61340-5-2:2007 NOTE Harmonized as CLC/TR 61340-5-2:2008 (not modified). IEC 61760-4 NOTE Harmonized as EN 61760-4. IEC/TR 62258-3 NOTE Harmonized as CLC/TR 62258-3. IEC 62435-1 NOTE Harmonized as EN 62435-1. IEC 62435-4 1) NOTE Harmonized as EN 62435-4 1). IEC 62435-5 NOTE Harmonized as EN 62435-5.
1) At draft stage. SIST EN 62435-2:2017



EN 62435-2:2017 3 Annex ZA (normative)
Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relev
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.