EN 60749-27:2006/A1:2012

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

This part of IEC 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive. ESD testing of semiconductor devices is selected from this test method, the human body model (HBM - see IEC 60749-26) or other test methods in the IEC 60749 series. The MM and HBM test methods produce similar but not identical results. Unless otherwise specified, the HBM test method is the one selected.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de machine (MM)

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 27. del: Preskušanje občutljivosti na elektrostatične izpraznitve (ESD) - Model stroja (MM)

Ta del standarda IEC 60749 določa standardni postopek za preskušanje in razvrščanje polprevodniških elementov glede na njihovo dovzetnost za poškodbe ali staranje, ko so izpostavljeni elektrostatični izpraznitvi (ESD) določenih modelov stroja (MM). Lahko se uporablja kot alternativna preskusna metoda za preskusno metodo modela elektrostatične izpraznitve človeškega telesa. Cilj je zagotovitev zanesljivih in ponovljivih preskusnih rezultatov elektrostatične izpraznitve, da se lahko opravijo pravilne opredelitve. Ta preskusna metoda se uporablja pri vseh polprevodniških elementih in je opredeljena kot destruktivna. Preskus elektrostatične izpraznitve elementov se izbere iz te metode, modela človeškega telesa (HBM – glej standard IEC 60749-26) ali druge testne metode v seriji standardov IEC 60749. S preskusnima metodama modelov stroja in metode človeškega telesa dobimo podobne, vendar ne enake rezultate. Če ni navedeno drugače, je treba izbrati preskusno metodo modela človeškega telesa.

General Information

• Status: Published
• Publication Date: 08-Nov-2012
• Withdrawal Date: 29-Oct-2015
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 09-Nov-2012
• Completion Date: 09-Nov-2012
• Ref Project: SIST EN 60749-27:2007/A1:2013 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Relations

• Amends: EN 60749-27:2006 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
• Effective Date: 28-Jan-2023

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60749-27:2007/A1:2013
01-januar-2013
3ROSUHYRGQLãNLHOHPHQWL0HKDQVNHLQNOLPDWVNHSUHVNXVQHPHWRGHGHO
3UHVNXãDQMHREþXWOMLYRVWLQDHOHNWURVWDWLþQHL]SUD]QLWYH(6'0RGHOVWURMD00
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic
discharge (ESD) sensitivity testing - Machine model (MM)
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung
der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie
27: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de machine
(MM)
Ta slovenski standard je istoveten z: EN 60749-27:2006/A1:2012
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN 60749-27:2007/A1:2013 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60749-27:2007/A1:2013

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SIST EN 60749-27:2007/A1:2013

EUROPEAN STANDARD
EN 60749-27/A1

NORME EUROPÉENNE
November 2012
EUROPÄISCHE NORM

ICS 31.080.01


English version


Semiconductor devices -
Mechanical and climatic test methods -
Part 27: Electrostatic discharge (ESD) sensitivity testing -
Machine model (MM)
(IEC 60749-27:2006/A1:2012)


Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques - Prüfverfahren -
Partie 27: Essai de sensibilité Teil 27: Prüfung der Empfindlichkeit gegen
aux décharges électrostatiques (DES) - elektrostatische Entladungen (ESD) -
Modèle de machine (MM) Machine Model (MM)
(CEI 60749-27:2006/A1:2012) (IEC 60749-27:2006/A1:2012)




This amendment A1 modifies the European Standard EN 60749-27:2006; it was approved by CENELEC on
2012-10-30. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which
stipulate the conditions for giving this amendment the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This amendment exists in three official versions (English, French, German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-27:2006/A1:2012 E

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SIST EN 60749-27:2007/A1:2013
EN 60749-27:2006/A1:2012 - 2 -
Foreword
The text of document 47/2135/FDIS, future amendment 1 to edition 2 of IEC 60749-27, prepared by
IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved
by CENELEC as EN 60749-27:2006/A1:2012.
The following dates are fixed:
(dop) 2013-07-30
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2015-10-30
• latest date by which the national
standards conflicting with the
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.

Endorsement notice
The text of the International Standard IEC 60749-27:2006/A1:2012 was approved by CENELEC as a
European Standard without any modification.

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SIST EN 60749-27:2007/A1:2013



IEC 60749-27

®


Edition 2.0 2012-09




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE




AMENDMENT 1

AMENDEMENT 1





Semiconductor devices – Mechanical and climatic test methods –

Part 27: Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)

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