IEC 61340-4-10:2012
(Main)Electrostatics - Part 4-10: Standard test methods for specific applications - Two-point resistance measurement
Electrostatics - Part 4-10: Standard test methods for specific applications - Two-point resistance measurement
IEC 61340-4-10:2012 provides a test method to measure the resistance between two points on an item's surface.
Electrostatique - Partie 4-10: Méthodes d'essai normalisées pour des applications spécifiques - Mesure de la résistance en deux points
La CEI 61340-4-10:2012 propose une méthode d'essai pour la mesure de la résistance entre deux points à la surface d'un élément.
General Information
Standards Content (Sample)
IEC 61340-4-10
®
Edition 1.0 2012-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electrostatics –
Part 4-10: Standard test methods for specific applications – Two-point
resistance measurement
Électrostatique –
Partie 4-10: Méthodes d’essai normalisées pour des applications spécifiques –
Mesure de la résistance en deux points
IEC 61340-4-10:2012
---------------------- Page: 1 ----------------------
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IEC 61340-4-10
®
Edition 1.0 2012-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electrostatics –
Part 4-10: Standard test methods for specific applications – Two-point
resistance measurement
Électrostatique –
Partie 4-10: Méthodes d’essai normalisées pour des applications spécifiques –
Mesure de la résistance en deux points
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX L
ICS 17.220.99; 29.020 ISBN 978-2-83220-488-7
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – 61340-4-10 © IEC:2012
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 General discussion . 5
4 Equipment . 5
4.1 Probe . 5
4.2 Sample support surface . 7
4.3 Resistance measurement apparatus . 7
4.4 Test leads . 8
4.5 Verification resistors . 8
5 Sample preparation . 9
6 Verification procedure . 9
7 Test procedure . 10
8 Test results . 10
Annex A (informative) Test method notes . 11
Figure 1 – Two-point probe configuration . 6
Figure 2 – Probe to instrumentation connection . 8
Figure 3 – Resistance verification fixture . 9
Figure 4 – Spring compression for measurement . 10
Table 1 – Material for two-point probe . 7
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61340-4-10 © IEC:2012 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROSTATICS –
Part 4-10: Standard test methods for specific applications –
Two-point resistance measurement
FOREWORD
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International Standard IEC 61340-4-10 has been prepared by IEC technical committee 101:
Electrostatics.
The text of this standard is based on ANSI/ESD STM11.13-2004. It was submitted to the
National Committees for voting under the Fast Track Procedure.
The text of this standard is based on the following documents:
FDIS Report on voting
101/368/FDIS 101/377/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
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– 4 – 61340-4-10 © IEC:2012
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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61340-4-10 © IEC:2012 – 5 –
ELECTROSTATICS –
Part 4-10: Standard test methods for specific applications –
Two-point resistance measurement
1 Scope
This part of IEC 61340 provides a test method to measure the resistance between two points
on an item’s surface.
4 12
It is intended for measuring the resistance of items in the range of 10≤R<10 Ω.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
ASTM D257-07, Standard Test Methods for DC Resistance or Conductance of Insulating
Materials
ASTM D2240, Standard Test Method for Rubber Property – Durometer Hardness
3 General discussion
This method is recommended for testing items with irregularly shaped surfaces. Conventional
concentric ring and parallel bar electrode configurations are used for testing planar items
only. However, most packaging items are not planar. Examples include shipping tubes, trays,
tote boxes and carrier tapes. This probe employs springs to apply consistent contact pressure
between the electrode and the item. Force created by springs is subject to variance from
wear, contamination and manufacturing tolerance. This variance is acceptable for this
application. Elastomeric electrodes compensate for uneven item surfaces. These features
yield consistent results between laboratories and test operators.
4 Equipment
4.1 Probe
Refer to Figure 1 and Table 1.
This two-point probe consists of an insulated metal body with a polytetrafluoroethylene
(PTFE) insulator inserted into each end. One insulator holds test leads; the other holds
receptacles that accept spring-loaded pins. One receptacle is surrounded by a cylindrical
insulator, which is surrounded by a metal shield. The pins are gold plated and have a spring
force of 4,56 N ±10 % at a travel of 4,32 mm (0,170 in). The pin tips are machined to accept
friction fitted 3,18 mm (0,125 in) diameter electrically conductive rubber electrodes. The
rubber has a Shore A (IRHD) durometer hardness of 50-70 (ASTM D2240). The electrodes
are 3,18 mm (0,125 in) long. Electrode volume resistivity is <500 Ω cm.
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– 6 – 61340-4-10 © IEC:2012
Probe parts
Leads
Probe
Electrode dimensions
PTFE
Insulator
Electrode
shield
3,18 mm 3,18 mm
(0,125 in) (0,125 in)
3,18 mm
Electrode
(0,125 in)
insulator
Electrodes and pins
Pin
Receptacles
PTFE
Electrodes
insulator
Body
Body
insulator
Shielded electrode
Pins
PTFE
Photo
insulator
Electrodes
NOTE The probe body size and shape
are not critical to the measurement and
may be of any convenient shape and size
Electrode
Receptacles
Electrode
shield
insulator
IEC 2129/12
Figure 1 – Two-point probe configuration
Table 1 provides a list of the key components in Figure 1.
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61340-4-10 © IEC:2012 – 7 –
Table 1 – Material for two-point probe
Item Detail Example
PTFE insulators Approximately 25,4 mm (1,0 in) by 12,7 mm
(0,5 in) diameter
Electrode shield
Metal tubing approximately 31,8 mm (1,25 in)
by 4,75 mm (0,187 in) diameter
Electrode Heat shrinkable PTFE or other insulator
insulator
Receptacles Receptacle – with solder cup Interconnect devices Inc. R-5-SC
Pins Spring pin force is 4,56 N at 4,32 mm Interconnect devices Inc. S-5-F-16.4-G
(0,170 in) travel. Tip machined to accept
electrode
Electrodes 3,18 mm (0,125 in) by 3,18 mm (0,125 in) Vanguard products, VC-7815
diameter conductive material with a Shore A
(IRHD) durometer hardness between 50 and
70. Volume resistivity to be <500 Ω-cm.
NOTE This is not intended to be a complete materials list for probe construction, but does provide key
elements that enable performance replication. Refer to Figure 1 for part placement. Part manufacturers and
numbers information are for reference. Equivalent parts may be used.
4.2 Sample support surface
An insulative surface, when used for specimen support, shall have a resistance of greater
13
than 1,0 Ω × 10 Ω when measured in accordance with ASTM D257-07.
4.3 Resistance measurement apparatus
The measurement apparatus, called the meter, whether it is a single meter or a collection of
instruments, has the following capabilities:
a) Meter for laboratory evaluations
The meter shall have an output voltage of 100 V (±5 %) while under load for
6
measurements of 1,0 Ω × 10 Ω and above, and 10 V (±5 %) while under load for
6
measurements less than 1,0 Ω × 10 Ω. The meter shall be capable of making
3 13
measurements from 1,0 Ω × 10 Ω (±10 % accuracy) to 1,0 Ω × 10 Ω (±10 % accuracy).
b) Meter for acceptance testing
The laboratory evaluation meter may be used for acceptance testing or the following may
be used. The meter shall have an open circuit voltage of 100 V (± 10 %) for measurements
6 6
of 1,0 Ω × 10 Ω and above, and 10 V (±10 %) for measurements less than 1,0 Ω × 10 Ω.
3
The meter shall be capable of making measurements from 1,0 Ω x 10 Ω (±20 % accuracy)
13
to 1,0 Ω × 10 Ω (±20 % accuracy).
In case of disagreement, the meter used for laboratory evaluations shall be used to
resolve any disputes.
c) Meter for compliance verification (periodic testing)
A meter meeting the requirements of laboratory evaluations or acceptance testing may be
used. The compliance verification meter shall be capable of making measurements one
order of magnitude above and below the intended measurement range. The output voltage
of compliance verification meters may vary from laboratory evaluation or acceptance
testing meters, and may be rated under load or open circuit. These meters shall be
correlated to the acceptance testing meter or the laboratory evaluation meter.
In case of disagreement, the meter used for acceptance testing meter or laboratory
evaluations shall be used to resolve any disputes.
NOTE A constant voltage meter as noted above was used to collect all data used to validate this standard test
method. Data was not collected to validate this equipment configuration.
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– 8 – 61340-4-10 © IEC:2012
4.4 Test leads
Test leads appropriate for the meter are required. A shielded lead from the probe body to the
instrument will greatly reduce electrical interference. Measurements for the verification of this
test method were made using a shielded lead. See Figure 2.
Instrumentation with shield connection
Shield s
s
Voltage source
++
Ammeter
++
Ammeter
--
Voltage source
--
Instrumentation without shield connection
Source
Sense
Ground
(reference
point)
Instrumentation with two leads
Sense
Source
IEC 2130/12
Figure 2 – Probe to instrumentation connection
4.5 Verification resistors
5
The low resistance verification fixture shall consist of a 1,0 Ω × 10 Ω (±1 %) resistor bonded
to two metal contact plates. The plates shall be of size and shape so that each probe
electrode contacts only one plate, and so that the plates are not in contact with each other.
The plates may be affixed to a material with the same properties as the sample support
surface. Figure 3 illustrates one possible configuration of a resistance verification fixture.
9
The high resistance verification fixture will consist of a 1,0 Ω × 10 Ω (±5 %) resistor bonded
to two metal contact plates. The plates shall be of a size and shape so that each probe
electrode contacts only one plate, and so that the plates are not in contact with each other.
The plates may be affixed to a material with the same properties as the sample support
surface. Figure 3 illustrates one possible configuration of a resistance verification fixture.
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61340-4-10 © IEC:2012 – 9 –
The actual value of the resistors should be measured periodically. This measured value
should be used to verify probe operation.
Fixture
Fixture with Probe
Resistor
Probe
Metal contact
plate
Sample support
surface material
IEC 2131/12
Figure 3 – Resistance verification fixture
5 Sample preparation
Condition six specimens of the item to be tested in an environment with a relative humidity of
º º º
12 % ± 3 % and at a temperature of 23 C± 3 C (72 ± 5) F. Preconditioning of the samples
shall be for a period of at least 48 h. All testing shall be conducted in the preconditioned
environment.
6 Verification procedure
Correct probe operation shall be verified by measuring known resistance values.
a) Connect the probe to the meter as shown in Figure 2.
b) Place the probe electrodes onto the low resistance verification fixture as shown in
Figure 3.
c) Compress the spring-loaded pins downward approximately half of the length of travel
(Figure 4).
d) Apply 10 V for 15 s and observe the resistance.
e) Record the resistance value. The value should be within 10 % of the actual resistor value.
f) Repeat the procedure using the high resistance verification fixture at 100 V.
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– 10 – 61340-4-10 © IEC:2012
Probe resting on test item. No Probe springs compressed about
spring compression half of the travel distance
for measurement
Probe
Item under
test
Sample support
surface
IEC 2132/12
Figure 4 – Spring compression for measurement
7 Test procedure
a) Connect the probe to meter as shown in Figure 2.
b) Place the specimen on the sample support surface.
c) Compress the spring-loaded pins downward approximately half of the length of travel
(Figure 4).
d) Apply 10 V for 15 s and observe the resistance. If the resistance reading is less than
6
1,0 Ω × 10 Ω, record the resistance value and proceed to list item f). If the resistance is
6
greater than or equal to 1,0 Ω × 10 Ω, proceed to list item e).
6
e) If the observed resistance in list item d) is greater than or equal to 1,0 Ω × 10 Ω, change
the voltage to 100 V and repeat the measurement. Record the resistance value.
f) Repeat the test for each remaining specimen.
8 Test results
Report the actual humidity, temperature and conditioning time, test voltage and resistance for
each specimen.
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61340-4-10 © IEC:2012 – 11 –
Annex A
(informative)
Test method notes
A.1 A change in the size of the specimen can affect the measurements.
A.2 Resistance measurements can be affected by the size and spacing between electrodes.
The 3,18 mm (0.125 in) diameter and 3,18 mm (0,125 in) spacing of the electrodes was
selected to test a wide range of packaging types and sizes.
A.3 Resistance measurements of a particular sample material may vary due to:
a) variations in sample surface composition or thickness;
b) compression of the sample by the force of the electrodes;
c) variations of the resistance in the electrode material;
d) change in material properties due to the measurement current;
e) cleanliness of electrodes or sample.
A.4 Testing of various electrode materials indicates that the use of harder rubber materials
than specified creates greater variation in readings.
_____________
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SOMMAIRE
AVANT-PROPOS . 13
1 Domaine d’application . 15
2 Références normatives . 15
3 Considérations générales . 15
4 Equipement . 15
4.1 Sonde . 15
4.2 Surface de support de l’échantillon . 17
4.3 Appareil de mesure de la résistance . 17
4.4 Conducteurs d’essai . 18
4.5 Résistances de vérification . 18
5 Préparation de l’échantillon . 19
6 Procédure de vérification . 19
7 Procédure d’essai . 20
8 Résultats d’essai . 20
Annexe A (informative) Notes relatives aux méthodes d’essai . 21
Figure 1 – Configuration d’une sonde à deux points . 16
Figure 2 – Raccordement entre la sonde et l’appareillage . 18
Figure 3 – Dispositif de vérification de la résistance . 19
Figure 4 – Compression des ressorts pour la mesure . 20
Tableau 1 – Matériaux pour sonde à deux points . 17
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61340-4-10 © CEI:2012 – 13 –
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
ÉLECTROSTATIQUE –
Partie 4-10: Méthodes d’essai normalisées
pour des applications spécifiques –
Mesure de la résistance en deux points
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