IEC 61340-4-8:2010

Electrostatics - Part 4-8: Standard test methods for specific applications - Discharge shielding - Bags

IEC 61340-4-8:2010 provides a test method for evaluating the performance of electrostatic discharge shielding bags. The design voltage for the test apparatus is 1 000 V. The purpose of this standard is to ensure that testing laboratories who use this test method to evaluate a given packaging material will obtain similar results.

Electrostatique - Partie 4-8: Méthodes d'essai normalisées pour des applications spécifiques - Blindage contre les décharges - Sacs

La CEI 61340-4-8:2010 fournit une méthode d'essai pour l'évaluation des performances des sacs de blindage contre les décharges électrostatiques. La tension de conception de l'appareillage d'essai est de 1 000 V. La présente norme est destinée à assurer que les laboratoires d'essai qui utilisent cette méthode d'essai pour évaluer un matériau d'emballage donné obtiendront des résultats similaires.

General Information

• Status: Published
• Publication Date: 13-Jan-2010
• ICS: 17.200.99 - Other standards related to thermodynamics
• ICS: 19.040 - Environmental testing
• ICS: 29.020 - Electrical engineering in general
• Technical Committee: TC 101 - Electrostatics
• Drafting Committee: WG 5 - TC 101/WG 5
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 27-Nov-2014

Relations

• Revised: IEC 61340-4-8:2014 - Electrostatics - Part 4-8: Standard test methods for specific applications - Electrostatic discharge shielding - Bags
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61340-4-8
®
Edition 1.0 2010-01
INTERNATIONAL
STANDARD


Electrostatics –
Part 4-8: Standard test methods for specific applications – Discharge shielding –
Bags



IEC 61340-4-8:2010(E)

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2010 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: [e-mail]
Web: www.iec.ch

About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: www.iec.ch/searchpub
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It also gives information on projects, withdrawn and replaced publications.
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on-line and also by email.
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in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
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Centre FAQ or contact us:
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---------------------- Page: 2 ----------------------
IEC 61340-4-8
®
Edition 1.0 2010-01
INTERNATIONAL
STANDARD


Electrostatics –
Part 4-8: Standard test methods for specific applications – Discharge shielding –
Bags


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
M
ICS 17.200.99; 29.020 ISBN 978-2-88910-505-2
® Registered trademark of the International Electrotechnical Commission

---------------------- Page: 3 ----------------------
– 2 – 61340-4-8 © IEC:2010(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5
1 Scope.6
2 Normative references.6
3 Terms and definitions .6
4 Required equipment.6
4.1 ESD simulator .6
4.2 Waveform verification equipment .7
4.2.1 Oscilloscope .7
4.2.2 Current probe .7
4.2.3 High voltage resistor .7
4.3 Capacitive probe.7
4.4 Discharge electrode and ground electrode .7
4.5 Bag size .7
4.6 Computer/software .7
4.7 Environmental chamber .7
5 ESD simulator waveform verification procedure.8
6 System verification procedure .8
7 Test procedure/conditioning .8
8 Reporting.9
Annex A (informative) Energy calculation program .13

Figure 1 – ESD simulator .10
Figure 2 – Parallel plate capacative probe .11
Figure 3 – Current waveform through a 500 Ω resistor.12

---------------------- Page: 4 ----------------------
61340-4-8 © IEC:2010(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

ELECTROSTATICS –

Part 4-8: Standard test methods for specific applications –
Discharge shielding – Bags


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61340-4-8 has been prepared by IEC technical committee 101:
Electrostatics.
The text of this standard is based on ANSI/ESD STM11.31-2006. It was submitted to the
National Committees for voting under the Fast Track Procedure.
The text of this standard is based on the following documents:
FDIS Report on voting
101/293/FDIS 101/297/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

---------------------- Page: 5 ----------------------
– 4 – 61340-4-8 © IEC:2010(E)
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61340 series, under the general title Electrostatics, can be found on
the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

---------------------- Page: 6 ----------------------
61340-4-8 © IEC:2010(E) – 5 –
INTRODUCTION
It is the intent of this part of IEC 61340 to provide industry with a common, repeatable method
for testing and determining the shielding abilities of electrostatic shielding bags.
This test method improved upon the existing industry test method for static shielding by
controlling some of the variables that were not previously addressed such as:
– discharge waveform characteristics;
– capacitive probe capacitance;
– bag size.
This test method has also made a significant change by discontinuing the use of two voltage
probes and incorporating a single current probe for measurement purposes. This was done to
eliminate the problems that were encountered with attempting to balance the voltage probes
which resulted in measurement errors.

---------------------- Page: 7 ----------------------
– 6 – 61340-4-8 © IEC:2010(E)
ELECTROSTATICS –

Part 4-8: Standard test methods for specific applications –
Discharge shielding – Bags



1 Scope
This part of IEC 61340 provides a test method for evaluating the performance of electrostatic
discharge shielding bags. The design voltage for the test apparatus is 1 000 V.
The purpose of this standard is to ensure that testing laboratories who use this test method to
evaluate a given packaging material will obtain similar results.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
ANSI/ESD STM5.1, ESD association standard test method for electrostatic discharge
1
sensitivity testing – Human body model (HBM) – Component level
ASTM D-257-78 (reapproved 1983), Standard test method for DC resistance or conductance of
2
insulating materials
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
electrostatic shield
barr
...

IEC 61340-4-8
®

Edition 1.0 2010-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Electrostatics –
Part 4-8: Standard test methods for specific applications – Discharge shielding –
Bags

Électrostatique –
Partie 4-8: Méthodes d’essai normalisées pour des applications spécifiques –
Blindage contre les décharges – Sacs

IEC 61340-4-8:2010

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2010 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
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publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
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---------------------- Page: 2 ----------------------
IEC 61340-4-8
®

Edition 1.0 2010-01

INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Electrostatics –
Part 4-8: Standard test methods for specific applications – Discharge shielding
– Bags

Électrostatique –
Partie 4-8: Méthodes d’essai normalisées pour des applications spécifiques –
Blindage contre les décharges – Sacs


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX M
ICS 17.200.99; 29.020 ISBN 978-2-88912-462-6

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

---------------------- Page: 3 ----------------------
– 2 – 61340-4-8  IEC:2010
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references. 6
3 Terms and definitions . 6
4 Required equipment . 6
4.1 ESD simulator . 6
4.2 Waveform verification equipment . 7
4.2.1 Oscilloscope . 7
4.2.2 Current probe . 7
4.2.3 High voltage resistor . 7
4.3 Capacitive probe . 7
4.4 Discharge electrode and ground electrode . 7
4.5 Bag size . 7
4.6 Computer/software . 7
4.7 Environmental chamber . 7
5 ESD simulator waveform verification procedure . 8
6 System verification procedure . 8
7 Test procedure/conditioning . 8
8 Reporting . 9
Annex A (informative) Energy calculation program . 13

Figure 1 – ESD simulator . 10
Figure 2 – Parallel plate capacative probe . 11
Figure 3 – Current waveform through a 500 Ω resistor . 12

---------------------- Page: 4 ----------------------
61340-4-8  IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

ELECTROSTATICS –

Part 4-8: Standard test methods for specific applications –
Discharge shielding – Bags


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61340-4-8 has been prepared by IEC technical committee 101:
Electrostatics.
The text of this standard is based on ANSI/ESD STM11.31-2006. It was submitted to the
National Committees for voting under the Fast Track Procedure.
This bilingual version (2011-04) replaces the English version.

---------------------- Page: 5 ----------------------
– 4 – 61340-4-8  IEC:2010
The text of this standard is based on the following documents:
FDIS Report on voting
101/293/FDIS 101/297/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61340 series, under the general title Electrostatics, can be found on
the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

---------------------- Page: 6 ----------------------
61340-4-8  IEC:2010 – 5 –
INTRODUCTION
It is the intent of this part of IEC 61340 to provide industry with a common, repeatable method
for testing and determining the shielding abilities of electrostatic shielding bags.
This test method improved upon the existing industry test method for static shielding by
controlling some of the variables that were not previously addressed such as:
– discharge waveform characteristics;
– capacitive probe capacitance;
– bag size.
This test method has also made a significant change by discontinuing the use of two voltage
probes and incorporating a single current probe for measurement purposes. This was done to
eliminate the problems that were encountered with attempting to balance the voltage probes
which resulted in measurement errors.

---------------------- Page: 7 ----------------------
– 6 – 61340-4-8  IEC:2010
ELECTROSTATICS –

Part 4-8: Standard test methods for specific applications –
Discharge shielding – Bags



1 Scope
This part of IEC 61340 provides a test method for evaluating the performance of electrostatic
discharge shielding bags. The design voltage for the test apparatus is 1 000 V.
The purpose of this standard is to ensure that testing laboratories who use this test method to
evaluate a given packaging material will obtain similar results.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
ANSI/ESD STM5.1, ESD association standard test method for electrostatic discharge
1
sensitivity testing – Human body model (HBM) – Component level
ASTM D-257-78 (reapproved 1983), Standard test method for DC resistance or conductance of
2
insulating materials
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
electrostatic shield
barrier or enclosure that limits the penetration of an electrostatic field
3.2
electrostatic discharge shield
barrier or enclosure that limits the passage of current and attenuates an electromagnetic field
resulting from an electrostatic discharge
4 Required equipment
4.1 ESD simulator
A basic ESD simulator is shown in Figure 1. This simulator and the resulting waveforms were
taken from ANSI/ESD STM5.1. The equivalent circuit for the simulator consists of a 100 pF
capacitor in series with a 1 500 Ω resistor.
___________
1
 ESD Association, 7900 Turin Road, Bldg. 3, Ste 2, Rome, NY 13440-2069, 315-339-6937, www.esda.org
2
 American Society for Testing and Materials (ASTM) 1916 Race Street, Philadelphia, PA 19103-1187, 215-299-
5400

---------------------- Page: 8 ----------------------
61340-4-8  IEC:2010 – 7 –
4.2 Waveform verification equipment
Equipment capable of verifying the pulse waveforms defined in this part shall include, but is not
limited to, a storage oscilloscope, a high voltage resistor and a suitable current probe.
4.2.1 Oscilloscope
A digital storage oscilloscope capable of a 200 MHz single shot bandwidth and a minimum
sampling rate of 500 MSPS.
4.2.2 Current probe
The current probe shall have a minimum frequency response of 500 MHz. Included in the
current probes that meet this requirement are a Tektronix CT-1, CT-2 and CT-6. The maximum
cable length shall be 1 m.
4.2.3 High voltage resistor
The resistor shall be a 500 Ω, 1 % tolerance, 1 000 V, low inductance, sputtered metal film
(Caddock Industries type MG or equivalent).
4.3 Capacitive probe
A parallel plate capacitive probe shall be constructed as shown in Figure 2. The capacitance
for the probe shall be 8 pF ± 2 pF. The probe capacitance can be verified according to
Clause 6, point c).
The spacer between the plates shall be made of an insulating material such as polycarbonate
or acrylic.
4.4 Discharge electrode and ground electrode
The discharge electrode and the ground electrode shall be 3,8 cm ± 0,025 cm (1,5" ± 0,010") in
diameter and shall be made of a conductive material. The support area that surrounds the
ground electrode should be 20 cm × 25 cm (8" × 10") and have a surface resistivity greater
13
than 1 Ω × 10 Ω per square as measured by ASTM D257-78.
4.5 Bag size
The bags used for this test should be 20 cm × 25 cm (8" × 10" with 20 cm (8") being the open
end.
NOTE If other bag sizes are used, care must be taken to ensure that the same size bag is used to provide
consistent and fair comparison of bags from various manufacturers. Bags, which are not large enough to have the
capacitive probe completely inside the bag may yield erroneous results. Bags with substantial differences in
thickness may yield results that do not correlate due to the increased transmission length through the bag.
4.6 Computer/software
A computer should be used to analyse the data that is acquired by the oscilloscope. A generic
description of the analysis system is described in Annex A.
4.7 Environmental chamber
A chamber is required that can meet the following environmental test conditions:
– control humidity to 12 % RH ± 3% RH at a temperature of 23° C ± 2° C (73° F ± 3° F);
– control humidity to 50 % RH ± 5% RH at a temperature of 23° C ± 2° C (73° F ± 3° F).

---------------------- Page: 9 ----------------------
– 8 – 61340-4-8  IEC:2010
5 ESD simulator waveform verification procedure
The following procedure shall be used to verify the resistive current (Ip) waveform from the
ESD simulator.
a) Connect the 500 Ω resistor specified in 4.2.3 to the wiring from the ESD simulator
discharge and ground connections keeping the cabling as short as possible (the cables
used should be the same as those used to perform the shielding test). Connect the current
probe around the wire end of the resistor which is connected to the ESD simulator ground.
Connect the discharge electrode cable to the tester output and the ground electrode cable
to equipment ground.
NOTE The conductive discharge and ground electrodes are not used for this portion of the test.
b) Connect the current probe to the storage oscilloscope. Set the scope input resistance to
50 Ω. (Match the impedance of the probe and the scope input.)
c) Set the ESD simulator discharge voltage to 1 000 V.
d) Set the horizontal time scale in the oscilloscope to 5 ns per division and initiate a pulse.
Observe the waveform rise time, peak current and leading edge ringing. All parameters
shall be within the limits specified in Figure 3a and Clause 5, point 3).
e) If necessary, adjust the ESD simulator voltage level until a peak current (Ip) of 0,50 A
± 10 % is obtained. This voltage level represents an equivalent 1 000 V discharge level.
This is the voltage level that will be used in Clause 7.
f) Set the horizontal time scale in the oscilloscope to 100 ns per division and observe the
complete current waveform. The pulse shall meet the decay time requirement (t ) as shown
d
in Figure 3b.
g) Using the computer analyse the resulting current waveform. The software shall be capable
of calculating energy for different resistances. For this portion of the procedure the
resistance is 2 000 Ω (this consists of the 1 500 Ω ESD simulator resistance and the 500 Ω
high-voltage resistor). The energy from a 1 000 V (100 pF) discharge shall be 50 μJ
2
(± 6 μJ). This is obtained from the equation E = 1/2 CV .
6 System verification procedure
a) Connect the 500 Ω resistor between the two conductive plates of the capacitive probe.
Place the capacitive probe between the discharge and ground electrodes. Ensure that the
discharge electrode, the capacitive probe and the ground electrode are vertically aligned
and that there is good contact between all three elements.
b) Connect the current probe to the storage oscilloscope. Set the scope input resistance to
50 Ω.
c) Set the horizontal time scale in the oscilloscope to 5 ns per division and initiate a 1 000 V
pulse. The peak current, due to the capacitive loading of the capacitive probe, shall not
reduce the peak current to less than 0,42 A due to the capacitance of the capacitive probe.
NOTE If the reading is outside of this range, check the capacitance of the capacitive probe with a capacitance
meter and/or adjust the length of the wiring if necessary.
7 Test procedure/conditioning
The test procedure shall be as follows:

a) Place a minimum of six samples of the product to be tested in an environmental chamber
set for the following conditions:
– temperature: 23 °C ± 2 °C (73 °F ± 3 °F)
– relative humidity: (12 ± 3) % RH
– conditioning period: minimum of 48 h

---------------------- Page: 10 ----------------------
61340-4-8  IEC:2010 – 9 –
Place an equal number of additional samples into an environmental chamber set for the
following conditions:
– temperature: 23 °C ± 2 °C (73 °F ± 3 °F)
– relative humidity: (50 ± 3) % RH
– conditioning period: minimum of 48 h.
NOTE All testing to be performed in the conditioned environment.
b) Place the capacitive probe into the 20 cm × 25 cm (8" × 10" bag such that it is 10 cm
(4") inside the bag opening and is centered, side to side. Insure good contact between the
electrodes, the bag and the probe. If other bag sizes are used, the capacitive probe is to be
placed in the geometric centre of the bag.
c) Set the oscilloscope horizontal time scale to 50 ns per division. The horizontal time scale
may have to be adjusted if the entire current waveform is not displayed on the oscilloscope.
d) Initiate a 1 000 V pulse (or 1 000 V equivalent) as determined in Clause 5, point e).
e) If using a computer, calculate and record the energy seen inside the bag (use 500 Ω for the
resistance setting for the software). Repeat step d) five more times to obtain six data points
per bag.
f) Repeat steps b) through e) for the remaining five samples.
g) Repeat steps b) through f) for the bags that were conditioned at 50 % RH.
8 Reporting
a) Report the average, minimum, maximum and standard deviation of the 36 energy readings
for both humidity levels.
b) Record the following extra information:
– peak current;
– bag size;
– bag thickness;
– conditioning period;
– test conditions;
– ESD simulator description (make/model/serial/number);
– scope, producer/model number and last calibration date.

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– 10 – 61340-4-8  IEC:2010


Discharge

Capacitive
R1 electrode
Bag under test
probe
10 kΩ-
10 MΩ

ESD simulator

R2
(Nominally 100 pF

500 Ω
and 1 500 pF)

SW1
Current

probe
Ground
electrode




Oscilloscope



IEC  2584/09
NOTE 1 The current probe is specified in 4.2.2.
NOTE 2 The 500 Ω resistor (R2) is specified in 4.2.3.
NOTE 3 Switch SW1 is closed 10 ms to 100 ms after the pulse delivery period to ensure that the discharge
electrode is not left in a charged state. The switch should be open at least 10 ms prior to the delivery of the next
pulse. R1 and SW1 are part of the ESD simulator’s internal circuitry.
NOTE 4 The performance of the tester is strongly influenced by parasitic capacitance and inductance.
Figure 1 – ESD simulator

---------------------- Page: 12 ----------------------
61340-4-8  IEC:2010 – 11 –





Insulating material

Such as polycarbonate or acrylic

1,3 cm

± 0,025 cm




Conductive plates
Diameter: 2,2 cm ± 0,025 cm
Thickness: 0,15 cm ± 0,15 cm






3,8 cm
Resistor connection

± 0,15 cm
points






3,8 cm
± 0,15 cm

IEC  2585/09







Figure 2 – Parallel plate capacative probe

---------------------- Page: 13 ----------------------
– 12 – 61340-4-8  IEC:2010

I
R
90 %
10 %
0
t
r
IEC  2586/09

Figure 3a – 50 ns per division

I
p
36,8 %
0
t
d
IEC  2587/09

Figure 3b – 100 ns per division

1. The current waveform shall be measured as described in Clause 5.
2. The current waveform shall have the following characteristics:
– pulse rise time (t ) 5 ns to 20 ns
r
– pulse decay time (t ) 200 ns ± 20 ns
d
– maximum peak to peak ringing (I ) shall be less than 15 % of I with no observable ringing 100 ns after the
R P
start of the pulse
– peak current (I ) shall be within 10 % of the value specified in Clause 5, point e).
P
Figure 3 – Current waveform through a 500 Ω resistor

---------------------- Page: 14 ----------------------
61340-4-8  IEC:2010 – 13 –
Annex A
(informative)

Energy calculation program

There are several methods of obtaining the energy measurements required by this test
procedure. It is possible to purchase a system where energy is directly calculated. However, in
the event that a computer is used to calculate energy, the following steps will help a user of the
test method establish his own program.
NOTE 1 When designing the data acquisition system, it is important to understand and account for any differences
between the scope's zero (or screen centre point) and the acquired waveform's zero point. For example, if the
acquired waveform was positioned one vertical position above the oscilloscope zero line then this area must be
subtracted from the calculated waveform area.
In order to calculate energy, the software performs the following sequence of steps:
1) Download the data from the storage oscilloscope to the computer.
2) Divide the voltage reading obtained from the scope by (5) to convert the reading to current
(I). The conversion factor for the CT-1 is 5 V/A.
NOTE 2 The conversion factor may differ if another type of current probe is used.
3) Take each of the current points and square these values.
2
4) Calculate the integral of the I versus t waveform.
2
5) Multiply the integral of I waveform by the resistance. For example, when calculating the
energy of the ESD simulator, the resistance for this situation consists of 2 000 Ω (500 Ω
precision resistor and 1 500 Ω from the ESD simulator in series). When calculating the
energy of the bag system the resistance used is 500 Ω.
The above software analysis description can be expressed by the following formula:
n
2
Energy = R ×t ×
∑
I
i
i=1
where
R is the value of the circuit resistance;
t is the time between samples;
I is the current from probe (voltage/5 for CT-1);
n is the total number of samples.

___________

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– 14 – 61340-4-8  CEI:2010
SOMMAIRE
AVANT-PROPOS . 15
INTRODUCTION . 17
1 Domaine d’application . 18
2 Références normatives . 18
3 Termes et définitions . 18
4 Equipement exigé . 19
4.1 Simulateur ESD . 19
4.2 Equipement de vérification de la forme d’onde . 19
4.2.1 Oscilloscope . 19
4.2.2 Sonde de courant. 19
4.2.3 Résistance à haute tension . 19
4.3 Sonde capacitive . 19
4.4 Electrode de décharge et électrode de terre . 19
4.5 Taille du sac . 19
4.6 Ordinateur/logiciel . 20
4.7 Chambre climatique .
...