IEC 62751-2:2014/AMD2:2023
(Amendment)Amendment 2 - Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters
Amendment 2 - Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters
Amendement 2 - Pertes de puissance dans les valves à convertisseur de source de tension (VSC) des systèmes en courant continu à haute tension (CCHT) - Partie 2: Convertisseurs multiniveaux modulaires
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IEC 62751-2
®
Edition 1.0 2023-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 2
AMENDEMENT 2
Power losses in voltage sourced converter (VSC) valves for high-voltage direct
current (HVDC) systems –
Part 2: Modular multilevel converters
Pertes de puissance dans les valves à convertisseur de source de tension (VSC)
des systèmes en courant continu à haute tension (CCHT) –
Partie 2: Convertisseurs multiniveaux modulaires
IEC 62751-2:2014-08/AMD2:2023-08(en-fr)
---------------------- Page: 1 ----------------------
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IEC 62751-2
®
Edition 1.0 2023-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 2
AMENDEMENT 2
Power losses in voltage sourced converter (VSC) valves for high-voltage direct
current (HVDC) systems –
Part 2: Modular multilevel converters
Pertes de puissance dans les valves à convertisseur de source de tension (VSC)
des systèmes en courant continu à haute tension (CCHT) –
Partie 2: Convertisseurs multiniveaux modulaires
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.200, 29.240.99 ISBN 978-2-8322-7446-0
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® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 62751-2:2014/AMD2:2023
© IEC 2023
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
POWER LOSSES IN VOLTAGE SOURCED
CONVERTER (VSC) VALVES FOR HIGH-VOLTAGE
DIRECT CURRENT (HVDC) SYSTEMS –
Part 2: Modular multilevel converters
AMENDMENT 2
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 2 to IEC 62751-2:2014 has been prepared by subcommittee 22F: Power
electronics for electrical transmission and distribution systems, of IEC technical committee 22:
Power electronic systems and equipment.
The text of this Amendment is based on the following documents:
Draft Report on voting
22F/712/CDV 22F/726/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Amendment is English.
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IEC 62751-2:2014/AMD2:2023 – 3 –
© IEC 2023
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications/.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
___________
3.1.11
no-load operating state
Add, to the end of the existing Note 1 to entry, added by IEC 62751-2/AMD1:2019, the following
sentence:
The integration time over which such losses are averaged might need to be longer than during normal operation, so
as to obtain the correct weighted average of the losses while blocked and the losses while switching.
4.2 Principles for loss determination
Replace, in the last sentence of the existing first paragraph, modified by
IEC 62751-2/AMD1:2019, the word "justify" with "explain".
Replace, in the last sentence of the existing third paragraph, modified by
IEC 62751-2/AMD1:2019, the text "is now under study in CIGRÉ WG B4-75" with "has been
studied by CIGRE WG B4-75 and is summarised in Annex C".
Delete the third sentence of the existing last paragraph, starting with "Care should also be
taken".
4.4 Loss calculation method
Delete, in the third sentence of the existing first paragraph, the words "for example valve
currents and switching energies".
Replace, in the last sentence of the existing second paragraph, the word "currents" with
"losses".
Delete, in the existing last paragraph, the words "and justified".
Add, to the end of the existing last paragraph, the following new sentence:
The main benefit of the numerical offline simulation is the determination of the average
distribution of the switching events across a cycle.
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– 4 – IEC 62751-2:2014/AMD2:2023
© IEC 2023
Add, after the existing last paragraph, the following new paragraph:
The remaining calculations can be performed analytically with a reasonable accuracy. If it can
be shown by the manufacturer that the distribution of switching events is reasonably accurate,
then the remaining calculations shall be allowed to be performed analytically.
4.5.2 Input data for numerical simulations
Replace, in the existing dashed list, modified by IEC 62751-2/AMD1:2019, the first dashed item
with the following new item:
The simulation model shall include a control block which reproduces the correct valve current
and switching pattern used in the complete system.
Delete, in the fourth dash of the existing dashed list, modified by IEC 62751-2/AMD1:2019, the
words "parasitic elements".
Replace, in the fifth dash of the existing dashed list, modified by IEC 62751-2/AMD1:2019, the
text "with a reduced number of" with "using a lumped representation of the".
Delete the last two dashed items of the existing dashed list, modified by
IEC 62751-2/AMD1:2019.
Add, after the existing dashed list, modified by IEC 62751-2/AMD1:2019, the following new
paragraph and list:
There are two different approaches/methods which may be applied:
1) Two-stage simulation and calculation method on the basis of simulated input values
In this approach, the input parameters required for a calculation shall be simulated using a
model which at least represents the on-state characteristics of the converter as well as the
switching pattern or control pattern for the switching of the cells. The on-state representation
may be chosen on the basis of worst-case characteristics (at high junction temperatures) or
on-state characteristics for lower junction temperatures. The simulated values (voltages,
currents and switching pattern) shall be used as input for the calculations. For the
calculations with the simulated values, the following two approaches may be used.
a) The semiconductor parameters are chosen for the rated or worst-case junction
temperature condition and the losses shall be calculated on the basis of the rated
junction temperature.
NOTE Due to the assumption of a worst-case temperature condition, this calculation will result in higher
losses than what can actually be observed in the real application.
b) Using a thermal model, the temperature-dependent semiconductor properties shall be
considered to calculate the losses for all semiconductors in the converter. Since only
steady-state scenarios are the basis for the loss calculation, the thermal heat
capacitances may be considered as negligible for the thermal model. The
temperature-dependent loss calculation may be executed in an iterative manner. For the
iterative calculation approach with the simulation values input, a steady-state condition
shall be reached to end the iteration process (as a suggestion ±1 K iteration error
border).
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IEC 62751-2:2014/AMD2:2023 – 5 –
© IEC 2023
2) Loss calculation with an exclusive simulation approach
In this approach, the junction temperature dependent semiconductor properties, such as
on-state voltages, and switching and recovery losses, shall be included in the simulation
model (i.e. a thermal model shall be included in the simulations, as for the mixed calculation
and simulation approach the thermal heat capacitances may be neglected for steady state
conditions). The simulation model shall represent the switching pattern or control pattern for
the switching of the cells. On the basis of the simulations, the losses shall be extracted
directly from the simulation model for all semiconductors in the converter. Similarly to option
1), it is possible to simplify the model by using semiconductor parameters applicable only
to the maximum rated junction temperature, but this will result in a more conservative
calculation.
4.5.3 Input data coming from numerical simulations
Add, at the end of the existing second paragraph, modified by IEC 62751-2/AMD1:2019, the
following sentence:
The required parameters to be derived from the simulations may vary depending on the chosen
calculation approach.
4.5.4 Converter station data
Add, in the second dash of the existing paragraph, modified by IEC 62751-2/AMD1:2019, the
words ", if any" after "filter configuration".
Add, in the third dash of the existing paragraph, modified by IEC 62751-2/AMD1:2019, the
words ", if any" after "phase reactor inductance".
4.6 Contents and structure of valve loss determination report
Replace, in the existing first paragraph of 4.6, added by IEC 62751-2/AMD1:2019, the words
"have been determined and including" with the words "have been determined at the project
execution stage, including".
5.1 General
Add, before the last paragraph, added by IEC 62751-2/AMD1:2019, the following new note:
NOTE When the rated DC current of the HVDC scheme is significantly lower than the rated current of the IGBT,
additional measurement points might be necessary in order to obtain acceptable accuracy.
5.2 IGBT conduction losses
Add, at the beginning of the existing first paragraph, the text "Where the piecewise-linear
approximation is used,".
Add, at the end of the existing last paragraph, modified by IEC 62751-2/AMD1:2019, the
following new sentence:
An analytical approach to calculate the current distribution for the individual submodule
elements may be acceptable (e.g. use of switching vector derived from simulation).
Add, after the existing last paragraph, modified by IEC 62751-2/AMD1:2019, the following new
paragraph:
For parallel connected semiconductors, the current sharing may be calculated on the basis of
the forward characteristics of the semiconductors (usually an equal current sharing).
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– 6 – IEC 62751-2:2014/AMD2:2023
© IEC 2023
5.3 Diode conduction losses
Add, at the beginning of the existing first paragraph, the text "Where the piecewise-linear
approximation is used,".
Add, at the end of the existing last paragraph, modified by IEC 62751-2/AMD1:2019, the
following new sentence:
An analytical approach to calculate the current distribution for the individual submodule
elements may be acceptable (e.g. use of switching vector derived from simulation).
Add, after the existing last paragraph, modified by IEC 62751-2/AMD1:2019, the following new
paragraph:
For parallel connected semiconductors the current sharing may be calculated on the basis of
the forward characteristics of the semiconductors (usually an equal current sharing).
5.4 Other conduction losses
Add, before the last sentence of the existing first paragraph, modified by
IEC 62751-2/AMD1:2019, the following new sentence:
The resistances of the busbars shall include not only the internal busbars within the MMC
building blocks but also the busbars connecting between MMC building blocks and between the
different stacks that make up the valve.
7 Losses in d.c. capacitors of the valve
Delete Note 2.
8.1 General
Replace, in the last sentence of the existing first paragraph, the words "control principles" with
"switching regime".
8.2 IGBT switching losses
Add, after the existing last paragraph, the following new paragraph:
For parallel connected semiconductors, the current sharing may be calculated on the basis of
the forward characteristics of the semiconductors (usually an equal current sharing).
8.3 Diode switching losses
Add, after the existing last paragraph, the following new paragraph:
For parallel connected semiconductors, the current sharing may be calculated on the basis of
the forward characteristics of the semiconductors (usually an equal current sharing).
Annex B Recommended data to be supplied with the loss calculation report
Replace, in the first sentence of the existing first paragraph of Annex B, added by
IEC 62751-2/AMD1:2019, the words "facilitate comparisons between reports from different
bidders" with "explicitly provide the assumptions taken for the loss calculation study".
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IEC 62751-2:2014/AMD2:2023 – 7 –
© IEC 2023
Replace, in the last sentence of the existing first paragraph of Annex B, added by
IEC 62751-2/AMD1:2019, the words "at which losses are subject to financial evaluation" with
"agreed between manufacturer and purchaser".
Table B.1 – Valve loss data
Add, after the sixth row (reading "13) rms current of IBGT T2 (I )" under column
T2rms
"Parameters") of Table B.1 of the existing Annex B, added by IEC 62751-2/AMD1:2019, the
following new row:
105) average switching 106) 107) 108)
frequency
a
Replace, in footnote of Table B.1 of the existing Annex B, added by IEC 62751-2/AMD1:2019,
the word "bidder" with "manufacturer".
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– 8 – IEC 62751-2:2014/AMD2:2023
© IEC 2023
Add, after the existing Annex B, added by IEC 62751-2/AMD1:2019, the following new annex:
Annex C
(informative)
Loss measurement
As transmission losses are directly related to the investment and operational costs, they are
one of the most important factors for high voltage direct current (HVDC) project evaluation. For
voltage source converters (VSC), valve losses are the largest part of the total converter station
losses and therefore the determination and evaluation of the VSC valve losses becomes highly
important.
At the time of writing of this Annex C, the losses of VSC valves are determined based on the
calculation methods of IEC 62751-1 and IEC 62751-2. The calculation method requires detailed
information, such as the parameters of semiconductor devices, VSC valve design
characteristics and operating modes, which are usually not directly available to the HVDC
system purchaser or user, who consequently finds it difficult to evaluate the calculated losses
results.
Therefore, CIGRÉ working group B4-75 was set up in 2017 to perform a feasibility study to
assess laboratory loss measurement methods on VSC valves for loss calculation evaluation
purposes and to make recommendations considering the pros and cons of such measurement
methods versus the methods in IEC 62751. The results of this working group were published in
2021 as CIGRÉ TB 844.
The brochure starts with a general description of losses in VSC HVDC converter valves, the
origins of different losses in components, the dependency of the losses on different operating
modes, as well as special aspects of different designs. This is followed by a summary of the
current practice for valve losses determination, including the modelling of the semiconductor
parameters and then by a discussion on how the transparency of the overall calculation process
can be enhanced. As the main study results of the WG B4-75, an evaluation of the existing
methods to measure losses is provided. This is complemented by an overview of the operation
conditions and additional aspects for losses measurement (such as commercial aspects) that
need to be taken into account. In the last part, the results are summarized and
recommendations for application of losses measurement are given, which can be used as
guidance for the introduction of losses measurements in the operational type tests of VSC
valves.
The conclusion of TB 844 is that the laboratory measurement of valve losses is feasible,
although the level of accuracy achievable is still quite poor. The general recommendation
therefore is that the laboratory measurement should become a standard part of the operational
type tests of the VSC valves, such that in the coming years greater industry experience can be
gained in this area. However, it is not recommended that the measured valve losses are used
as part of the financial evaluation criteria for the HVDC project, until there is a good level of
industry experience and consensus over what should be a realistically achievable level of
measurement uncertainty.
---------------------- Page: 10 ----------------------
IEC 62751-2:2014/AMD2:2023 – 9 –
© IEC 2023
Bibliography
Replace the existing reference "CIGRÉ WG B4-75, Feasibility study for assessment of lab
losses measurement of VSC valves" with the following new reference:
CIGRÉ Technical Brochure 844, Feasibility study for assessment of lab losses measurement of
VSC valves, WG B4-75
___________
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– 10 – IEC 62751-2:2014/AMD2:2023
© IEC 2023
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
PERTES DE PUISSANCE DANS LES VALVES À CONVERTISSEUR
DE SOURCE DE TENSION (VSC) DES SYSTÈMES
EN COURANT CONTINU À HAUTE TENSION (CCHT) –
Partie 2: Convertisseurs multiniveaux modulaires
AMENDEMENT 2
AVANT-PROPOS
1) La Commission Électrotechnique Internationale (IEC) est une organisation mondiale de normalisation composée
de l’ensemble des comités électrotechniques nationaux (Comités nationaux de l’IEC). L’IEC a pour objet de
favoriser la coopération internationale pour toutes les questions de normalisation dans les domaines de
l’électricité et de l’électronique. À cet effet, l'IEC – entre autres activités – publie des Normes internationales,
des Spécifications techniques, des Rapports techniques, des Spécifications accessibles au public (PAS) et des
Guides (ci-après dénommés "Publication(s) de l'IEC"). Leur élaboration est confiée à des comités d'études, aux
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internationales, gouvernementales et non gouvernementales, en liaison avec l’IEC, participent également aux
travaux. L’IEC collabore étroitement avec l'Organisation Internationale de Normalisation (ISO), selon des
conditions fixées par accord entre les deux organisations.
2) Les décisions ou accords officiels de l’IEC concernant les questions techniques représentent, dans la mesure du
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L’Amendement 2 de l’IEC 62751-2:2014 a été établi par le sous-comité 22F: Électronique de
puissance pour les réseaux électriques de transport et de distribution, du comité d’études 22
de l'IEC: Systèmes et équipements électroniques de puissance.
---------------------- Page: 12 ----------------------
IEC 62751-2:2014/AMD2:2023 – 11 –
© IEC 2023
Le texte de cet Amendement est issu des documents suivants:
Projet Rapport de vote
22F/712/CDV 22F/726/RVC
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à son approbation.
La langue employée pour l’élaboration de cet Amendement est l’anglais.
Ce document a été rédigé selon les Directives ISO/IEC, Partie 2, il a été développé selon les
Directives ISO/IEC, Partie 1 et les Dir
...
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