Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods (IEC 62810:2015)

This International Standard relates to a measurement method for complex permittivity of a
dielectric rod at microwave frequency. This method has been developed to evaluate the
dielectric properties of low-loss materials in coaxial cables and electronic devices used in
microwave systems. It uses the TM010 mode in a circular cylindrical cavity and presents
accurate measurement results of a dielectric rod sample, where the effect of sample insertion
holes is taken into account accurately on the basis of the rigorous electromagnetic analysis.
In comparison with the conventional method described in IEC 60556 [2]1, this method has the
following characteristics:
• the values of the relative permittivity ε ' and loss tangent tand of a dielectric rod sample
can be measured accurately and non-destructively;
• the measurement accuracy is within 1,0 % for ε ' and within 20 % for tand ;
• the effect of sample insertion holes is corrected using correction charts presented;
• this method is applicable for the measurements on the following condition:
– frequency: 1 GHz ≦f ≦10 GHz;
– relative permittivity: 1 ≦ε ' ≦100;
– loss tangent: 10–4 ≦tand ≦10–1.

Zylindrisches Hohlraumverfahren zur Messung der komplexen Permittivität von verlustarmen dielektrischen Stäben (IEC 62810:2015)

Mesure de la permitivité complexe des barreaux diélectriques à faibles pertes par la méthode de la cavité cylindrique (IEC 62810:2015)

L'IEC 62810:2015 traite d’une méthode de mesure de la permittivité complexe d'un barreau diélectrique en hyperfréquence. La présente méthode a été développée pour évaluer les propriétés diélectriques des matériaux à faibles pertes dans les câbles coaxiaux et les dispositifs électroniques utilisés dans les systèmes à hyperfréquences. Elle utilise le mode TM010 dans une cavité cylindrique circulaire et présente des résultats de mesure précis d'un échantillon de barreau diélectrique, pour lequel l'effet des trous d'insertion de l’échantillon est pris en compte avec précision, en se fondant sur l'analyse électromagnétique rigoureuse.

Metoda s valjasto votlino za merjenje kompleksne permitivnosti (dielektrične konstante) nizkoizgubnih dielektričnih palic (IEC 62810:2015)

Ta mednarodni standard se nanaša na metodo za merjenje kompleksne permitivnosti dielektrične palice pri mikrovalovni frekvenci. Ta metoda je bila razvita za oceno dielektričnih lastnosti nizkoizgubnih materialov v koaksialnih kablih in elektronskih napravah, ki se uporabljajo v mikrovalovnih sistemih. Uporablja način TM010 v krožni valjasti votlini in predstavlja točne merilne rezultate vzorca dielektrične palice, pri čemer se učinek vstavitvenih lukenj v vzorcu točno upošteva na podlagi stroge elektromagnetne analize. V primerjavi z običajno metodo iz standarda IEC 60556 [2]1 ima ta metoda naslednje značilnosti:
• vrednosti relativne permitivnosti εr in izgubnega faktorja tanδ vzorca dielektrične palice je mogoče izmeriti točno in neporušitveno;
• merilna točnost je v območju 1,0 % za ε ' in znotraj 20 % za tand;
• učinek vstavitvenih lukenj v vzorcu se popravi z uporabo predstavljenih korekcijskih tabel;
• ta metoda se uporablja za meritve pod naslednjim pogojem:
– frekvenca: 1 GHz ≦ f ≦ 10 GHz;
– relativna permitivnost: 1 ≦ε ' ≦100;
– izgubni faktor: 10–4 ≦tand ≦10–1.

General Information

Status
Published
Publication Date
09-Sep-2015
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
08-Jun-2015
Due Date
13-Aug-2015
Completion Date
10-Sep-2015

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SLOVENSKI STANDARD
SIST EN 62810:2015
01-oktober-2015
0HWRGDVYDOMDVWRYRWOLQR]DPHUMHQMHNRPSOHNVQHSHUPLWLYQRVWL GLHOHNWULþQH
NRQVWDQWH QL]NRL]JXEQLKGLHOHNWULþQLKSDOLF ,(&

Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods

(IEC 62810:2015)
Zylindrisches Hohlraumverfahren zur Messung der komplexen Permittivität von
verlustarmen dielektrischen Stäben (IEC 62810:2015)

Mesure de la permitivité complexe des barreaux diélectriques à faibles pertes par la

méthode de la cavité cylindrique (IEC 62810:2015)
Ta slovenski standard je istoveten z: EN 62810:2015
ICS:
33.120.30 5DGLRIUHNYHQþQLNRQHNWRUML R.F. connectors
5)
SIST EN 62810:2015 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN 62810:2015
---------------------- Page: 2 ----------------------
SIST EN 62810:2015
EUROPEAN STANDARD EN 62810
NORME EUROPÉENNE
EUROPÄISCHE NORM
May 2015
ICS 33.120.30
English Version
Cylindrical cavity method to measure the complex permittivity of
low-loss dielectric rods
(IEC 62810:2015)

Mesure de la permitivité complexe des barreaux Zylindrisches Hohlraumverfahren zur Messung der

diélectriques à faibles pertes par la méthode komplexen Permittivität von verlustarmen

de la cavité cylindrique dielektrischen Stäben
(IEC 62810:2015) (IEC 62810:2015)

This European Standard was approved by CENELEC on 2015-03-24. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN 62810:2015 E
---------------------- Page: 3 ----------------------
SIST EN 62810:2015
EN 62810:2015 - 2 -
Foreword

The text of document 46F/242/CDV, future edition 1 of IEC 62810, prepared by SC 46F, "R.F. and

microwave passive components", of IEC TC 46, "Cables, wires, waveguides, R.F. connectors, R.F. and

microwave passive components and accessories" was submitted to the IEC-CENELEC parallel vote and

approved by CENELEC as EN 62810:2015.
The following dates are fixed:
(dop) 2015-12-24
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2018-03-24
standards conflicting with the
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent

rights.
Endorsement notice

The text of the International Standard IEC 62810:2015 was approved by CENELEC as a European

Standard without any modification.

In the official version, for Bibliography, the following note has to be added for the standard indicated:

IEC 60556 NOTE Harmonised as EN 60556.
---------------------- Page: 4 ----------------------
SIST EN 62810:2015
IEC 62810
Edition 1.0 2015-02
INTERNATIONAL
STANDARD
colour
inside
Cylindrical cavity method to measure the complex permittivity of low-loss
dielectric rods
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.120.30 ISBN 978-2-8322-2264-5

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 5 ----------------------
SIST EN 62810:2015
– 2 – IEC 62810:2015 © IEC 2015
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Measurement parameters ................................................................................................ 5

4 Theory and calculation equations .................................................................................... 5

5 Measurement system ..................................................................................................... 12

6 Measurement procedure ................................................................................................ 14

6.1 Preparation of measurement apparatus................................................................. 14

6.2 Measurement of reference level ............................................................................ 14

6.3 Measurement of cavity parameters: σ .................................................................. 14

6.4 Measurement of complex permittivity of test sample: ε', tan d................................ 15

Annex A (informative) Example of measurement results and accuracy ................................. 16

A.1 Measurement of ε' and tand values ....................................................................... 16

A.2 Measurement uncertainty of ε' and tand ................................................................ 17

Bibliography .......................................................................................................................... 19

Figure 1 – Structure of a cylindrical cavity resonator ............................................................... 6

Figure 2 – Correction factor C for ε’....................................................................................... 7

Figure 3 – Correction factor C for tand with the different values of d .................................... 9

2 1

Figure 4 – Schematic diagram of measurement systems ....................................................... 13

Figure 5 – Resonance frequency f , insertion attenuation IA and half-power band
0 0

width f ............................................................................................................................. 14

Figure 6 – Frequency responses of the TM mode of cylindrical cavity ............................. 15

010

Table 1 – Numerical values of correction factor C ................................................................. 8

Table 2 – Numerical values of correction factor C ............................................................... 10

Table 3 – Numerical values of correction factor C ............................................................... 11

Table A.1 – The parameters of the cavity and the rod sample ............................................... 16

Table A.2 – The resonant frequencies and unloaded Q-factors ............................................. 16

Table A.3 – The approximate values and the relative conductivity value ............................... 16

Table A.4 – Correction factors and the measurement results ................................................ 16

Table A.5 – The measurement uncertainty of ε’ ..................................................................... 17

Table A.6 – The measurement uncertainty of tand ................................................................ 18

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SIST EN 62810:2015
IEC 62810:2015 © IEC 2015 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CYLINDRICAL CAVITY METHOD TO MEASURE
THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC RODS
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

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agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 62810 has been prepared by subcommittee 46F: R.F. and

microwave passive components, of IEC technical committee 46: Cables, wires, waveguides,

R.F. connectors, R.F. and microwave passive components and accessories.
The text of this standard is based on the following documents:
CDV Report on voting
46F/242/CDV 46F/260/RVC

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

The committee has decided that the contents of this publication will remain unchanged until

the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data

related to the specific publication. At this date, the publication will be
---------------------- Page: 7 ----------------------
SIST EN 62810:2015
– 4 – IEC 62810:2015 © IEC 2015
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct

understanding of its contents. Users should therefore print this document using a

colour printer.
---------------------- Page: 8 ----------------------
SIST EN 62810:2015
IEC 62810:2015 © IEC 2015 – 5 –
CYLINDRICAL CAVITY METHOD TO MEASURE
THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC RODS
1 Scope

This International Standard relates to a measurement method for complex permittivity of a

dielectric rod at microwave frequency. This method has been developed to evaluate the

dielectric properties of low-loss materials in coaxial cables and electronic devices used in

microwave systems. It uses the TM mode in a circular cylindrical cavity and presents

010

accurate measurement results of a dielectric rod sample, where the effect of sample insertion

holes is taken into account accurately on the basis of the rigorous electromagnetic analysis.

In comparison with the conventional method described in IEC 60556 [2] , this method has the

following characteristics:

• the values of the relative permittivity ε' and loss tangent tand of a dielectric rod sample

can be measured accurately and non-destructively;
• the measurement accuracy is within 1,0 % for ε' and within 20 % for tand;

• the effect of sample insertion holes is corrected using correction charts presented;

• this method is applicable for the measurements on the following condition:
– frequency: 1 GHz ≦f ≦10 GHz;
– relative permittivity: 1 ≦ε' ≦100;
–4 –1
– loss tangent: 10 ≦tand ≦10 .
2 Normative references
Void.
3 Measurement parameters
The measurement parameters are defined as follows:
ε = ε'-jε" (1)
tand = ε"/ε' (2)

where ε' and ε" are the real and imaginary parts of the complex relative permittivity ε .

4 Theory and calculation equations

A resonator structure used in these measurements is shown in Figure 1. A cavity, made with

copper, with diameter D and height H has sample insertion holes with diameter d and depth g

having ε' and tand is inserted into
oriented coaxially. A dielectric rod sample of diameter d
the holes.
Figures in square brackets refer to the Bibliography.
---------------------- Page: 9 ----------------------
SIST EN 62810:2015
– 6 – IEC 62810:2015 © IEC 2015

The TM mode, where the electric field component in the cavity is parallel to the sample

010

rod, is used for the measurement. Taking account of the effect of sample insertion holes

calculated on the basis of the rigorous electromagnetic field analysis, ε' and tand are

determined from the measured values of the resonant frequency f and the unloaded Q-factor

Q . To avoid the tedious numerical calculation and make the measurements easy, the

following process is taken in this measurement:
Cylindrical cavity Dielectric rod (sample)
Sample insertion hole
Coaxial cable
with small loop
IEC
Figure 1 – Structure of a cylindrical cavity resonator
The following steps shall be taken:

1) At the first step, obtain approximate values ε and tand from the f and Q values by

p p 0 u

using the simple perturbation formulas, where the effect of sample insertion holes is

neglected. The subscript p denotes the calculated values using the following perturbation

formulas:
1 f − f  D 
0 1
 
ε = +1 (3)
 
α f d
1 1
 
   
1 D 1 1
tand =    −  (4)
   
2αε d Q Q
p  1   u1 u0 
where α = 1 J ( x ) = 1,855 .
1 01

J ( x) is the Bessel function of order n of first kind and x = 2,405 is the first root of

n 01

J ( x) = 0 . f and Q are the resonant frequency and unloaded Q-factor measured for the

0 u0

cavity without a sample, respectively. f and Q are ones measured for the cavity with a

1 u1
sample.

2) In the second step, obtain accurate values ε' and tand from ε and tand values by using

p p

the following equations with correction factors calculated based on the rigorous analysis:

ε ′ = C ε
(5)
1 p
tand = C tand (6)
2 p
g H g
---------------------- Page: 10 ----------------------
SIST EN 62810:2015
IEC 62810:2015 © IEC 2015 – 7 –

where correction factors C and C , due to the sample insertion holes and errors included

1 2

in the perturbation formulas, are calculated numerically by using the Ritz-Galerkin method

[3][5], as shown in Figure 2 and Figure 3, and the corresponding data are listed in detail in

Table 1, 2, and 3. The missing data of C and C can be obtained by interpolation or

1 2

extrapolation from the tables. The correction factors shown in these figures are calculated

for the cavity with D = 76,5 mm, H = 20,0 mm, d = 3,0 mm, and g = 10,0 mm, where the

resonant frequency is about 3 GHz. C is also used for a cavity having the same aspect

ratios as H/D, d /D and g/D.

It is found from the analysis for a cavity with insertion holes which constitute a cut-off TM

mode cylindrical waveguide that f converges to a constant value for g>10 mm and d = 3 mm.

0 2

Therefore, the correction factors shown in Figure 2 and Figure 3 are applicable to a dielectric

sample rod with d <3 mm and ε’ below the value c
...

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