Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method (IEC 61726:2015)

The requirements of modern electronic equipment have indicated a demand for a method for
testing screening attenuation of microwave components over their whole frequency range.
Convenient test methods exist for low frequencies and components of regular shape. These
test methods are described in the relevant IEC product specifications (e.g.
IEC 62153-4-3). For higher frequencies and for components of irregular shape, a new test
method has become necessary and such a test method is described in this International
Standard.
This International Standard describes the measurement of screening attenuation by the
reverberation chamber test method, sometimes named mode stirred chamber, suitable for
virtually any type of microwave component and having no theoretical upper frequency limit. It is
only limited toward low frequencies due to the size of the test equipment, which is frequencydependent
and is only one of several methods of measuring screening attenuation.
For the purpose of this standard, examples of microwave components are waveguides, phase
shifters, diplexers/multiplexers, power dividers/combiners etc.

Konfektionierte Kabel, Kabel, Steckverbinder und passive Mikrowellenbauteile - Messung der Schirmdämpfung mit dem Strahlungskammerverfahren

Câbles, cordons, connecteurs et composants hyperfréquence passifs - Mesure de l'affaiblissement d'écran par la méthode de la chambre réverbérante

L'IEC 61726:2015 décrit la mesure de l'affaiblissement d'écran par la méthode d'essai de la chambre réverbérante, parfois appelée «chambre à brassage de modes». Elle convient pour pratiquement n'importe quel type de composants hyperfréquence et n'a, en théorie, pas de limite supérieure de fréquence. Elle est simplement limitée vers les fréquences basses en raison de la taille de l'équipement d'essai qui dépend de la fréquence. Elle ne constitue qu'une des méthodes de mesure de l'affaiblissement d'écran. Pour les besoins de la présente norme, des exemples de composants hyperfréquence sont les guides d'ondes, les déphaseurs, les diplexeurs/multiplexeurs, les répartiteurs/combineurs de puissance, etc. Cette troisième édition annule et remplace la seconde édition, publiée en 1999. La présente édition constitue une révision technique. Elle tient compte des dernières évolutions dans la conception des chambres réverbérantes, décrites dans l'IEC 61000-4-21, qui fait également référence à la présente norme en tant que méthode d'essai possible. De plus, une procédure de mesure alternative est ajoutée, permettant de réduire le temps de mesure nécessaire.

Kabelski sestavi, kabli, konektorji in pasivne mikrovalovne komponente - Meritve zaslonskega slabljenja z metodo odmevne komore (IEC 61726:2015)

Zahteve sodobne elektronske opreme nakazujejo potrebe po metodi za preskušanje zaslonskega slabljenja mikrovalovnih komponent za celotno frekvenčno območje. Obstajajo priročne metode za preskušanje nizkih frekvenc in komponent pravilne oblike. Te preskusne metode so opisane v ustreznih specifikacijah standarda IEC za izdelek (npr. standard IEC 62153-4-3). Višje frekvence in komponente nepravilne oblike zahtevajo novo preskusno metodo, ki je opisana v tem mednarodnem standardu.
Ta mednarodni standard opisuje meritve zaslonskega slabljenja s preskusno metodo odmevne komore ali mešalne komore, kot je včasih imenovana, ki je primerna za skorajda vsako vrsto mikrovalovnih komponent in nima teoretične zgornje mejne vrednosti frekvence. Zaradi velikosti preskusne opreme, ki je odvisna od frekvence, je omejena le na nizke frekvence in je le ena od številnih metod meritve zaslonskega slabljenja. V tem mednarodnem standardu so primeri mikrovalovnih komponent valovodi, preklopniki napetosti, diplekserji/multiplekserji, delilniki/združevalniki virov napajanja itd.

General Information

Status
Published
Publication Date
25-Feb-2016
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
26-Nov-2015
Due Date
31-Jan-2016
Completion Date
26-Feb-2016

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SLOVENSKI STANDARD
SIST EN 61726:2016
01-april-2016
Kabelski sestavi, kabli, konektorji in pasivne mikrovalovne komponente - Meritve
zaslonskega slabljenja z metodo odmevne komore (IEC 61726:2015)

Cable assemblies, cables, connectors and passive microwave components - Screening

attenuation measurement by the reverberation chamber method (IEC 61726:2015)
Ta slovenski standard je istoveten z: EN 61726:2015
ICS:
33.120.10 Koaksialni kabli. Valovodi Coaxial cables. Waveguides
33.120.30 5DGLRIUHNYHQþQLNRQHNWRUML RF connectors
5)
SIST EN 61726:2016 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN 61726:2016
---------------------- Page: 2 ----------------------
SIST EN 61726:2016
EUROPEAN STANDARD EN 61726
NORME EUROPÉENNE
EUROPÄISCHE NORM
November 2015
ICS 33.120.10; 33.120.30 Supersedes EN 61726:2000
English Version
Cable assemblies, cables, connectors and passive microwave
components - Screening attenuation measurement by the
reverberation chamber method
(IEC 61726:2015)

Câbles, cordons, connecteurs et composants Konfektionierte Kabel, Kabel, Steckverbinder und passive

hyperfréquence passifs - Mesure de l'affaiblissement Mikrowellenbauteile - Messung der Schirmdämpfung mit

d'écran par la méthode de la chambre réverbérante dem Strahlungskammerverfahren
(IEC 61726:2015) (IEC 61726:2015)

This European Standard was approved by CENELEC on 2015-10-13. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN 61726:2015 E
---------------------- Page: 3 ----------------------
SIST EN 61726:2016
EN 61726:2015
European foreword

The text of document 46/551/FDIS, future edition 3 of IEC 61726, prepared by IEC/TC 46 "Cables,

wires, waveguides, R.F. connectors, R.F. and microwave passive components and accessories" was

submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61726:2015.

The following dates are fixed:
(dop) 2016-07-13
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2018-10-13
standards conflicting with the
document have to be withdrawn
This document supersedes EN 61726:2000.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such

patent rights.
Endorsement notice

The text of the International Standard IEC 61726:2015 was approved by CENELEC as a European

Standard without any modification.
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SIST EN 61726:2016
EN 61726:2015
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are

indispensable for its application. For dated references, only the edition cited applies. For undated

references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:

www.cenelec.eu.
Publication Year Title EN/HD Year
IEC TS 62153-4-1 - Metallic communication cable test methods - -
- Part 4-1: Electromagnetic compatibility
(EMC) - Introduction to electromagnetic
screening measurements
IEC 61000-4-21 - Electromagnetic compatibility (EMC) -- Part EN 61000-4-21 -
4-21: Testing and measurement
techniques - Reverberation chamber test
methods
IEC 61196-1 - Coaxial communication cables - Part 1: - -
Generic specification - General, definitions
and requirements
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SIST EN 61726:2016
---------------------- Page: 6 ----------------------
SIST EN 61726:2016
IEC 61726
Edition 3.0 2015-09
INTERNATIONAL
STANDARD
Cable assemblies, cables, connectors and passive microwave components –
Screening attenuation measurement by the reverberation chamber method
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.120.10; 33.120.30 ISBN 978-2-8322-2893-7

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 7 ----------------------
SIST EN 61726:2016
– 2 – IEC 61726:2015 © IEC 2015
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ....................................................................................................... 5

3 Terms and definitions....................................................................................................... 5

4 Basic description of the reverberation chamber method .................................................... 5

5 Measurement of the screening attenuation of the device under test (DUT) ........................ 6

6 Description of the test set-up ........................................................................................... 6

6.1 Reverberation chamber ........................................................................................... 6

6.2 Mode stirrer ............................................................................................................ 7

6.3 Antennas................................................................................................................. 7

6.4 Test equipment ....................................................................................................... 7

6.5 Device under test (DUT) .......................................................................................... 7

6.6 Linking devices ....................................................................................................... 8

7 Measurement procedure .................................................................................................. 8

7.1 General ................................................................................................................... 8

7.2 Measurement of the DUT ........................................................................................ 9

7.2.1 General ........................................................................................................... 9

7.2.2 Standard measurement .................................................................................... 9

7.2.3 Fast measurement ........................................................................................... 9

7.3 Measurement of the insertion loss of the cavity ...................................................... 10

7.4 Control of the test set-up ....................................................................................... 10

7.4.1 Dynamic range ............................................................................................... 10

7.4.2 Insertion loss of the chamber ......................................................................... 11

7.4.3 Measurement of a calibrator ........................................................................... 11

7.4.4 Measurement of lossy DUT ............................................................................ 11

7.5 Revolution speed of the mode stirrer ..................................................................... 11

7.6 Test frequencies ................................................................................................... 11

7.7 Voltage standing wave ratio (VSWR) ..................................................................... 12

8 Evaluation of the test results .......................................................................................... 12

Annex A (informative) Relationship between transfer impedance and screening

attenuation ............................................................................................................................ 13

Annex B (informative) Example of a calibrator ...................................................................... 14

Bibliography .......................................................................................................................... 16

Figure 1 – Example of a test set-up ......................................................................................... 7

Figure B.1 – Basic construction details .................................................................................. 14

---------------------- Page: 8 ----------------------
SIST EN 61726:2016
IEC 61726:2015 © IEC 2015 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CABLE ASSEMBLIES, CABLES, CONNECTORS AND PASSIVE
MICROWAVE COMPONENTS –
SCREENING ATTENUATION MEASUREMENT BY THE
REVERBERATION CHAMBER METHOD
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 61726 has been prepared by IEC technical committee 46: Cables,

wires, waveguides, R.F. connectors, R.F. and microwave passive components and
accessories.

This third edition cancels and replaces the second edition, published in 1999. This edition

constitutes a technical revision.

It takes into account the latest developments in the design of reverberation chambers as

described in IEC 61000-4-21, which is also referencing this standard as a possible test method.

Furthermore, an alternative measurement procedure is added which is able to reduce the

measurement time needed.
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SIST EN 61726:2016
– 4 – IEC 61726:2015 © IEC 2015
The text of this standard is based on the following documents:
FDIS Report on voting
46/551/FDIS 46/569/RVD

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

The committee has decided that the contents of this publication will remain unchanged until the

stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to

the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
---------------------- Page: 10 ----------------------
SIST EN 61726:2016
IEC 61726:2015 © IEC 2015 – 5 –
CABLE ASSEMBLIES, CABLES, CONNECTORS AND PASSIVE
MICROWAVE COMPONENTS –
SCREENING ATTENUATION MEASUREMENT BY THE
REVERBERATION CHAMBER METHOD
1 Scope

The requirements of modern electronic equipment have indicated a demand for a method for

testing screening attenuation of microwave components over their whole frequency range.

Convenient test methods exist for low frequencies and components of regular shape. These

test methods are described in the relevant IEC product specifications (e.g.

IEC 62153-4-3). For higher frequencies and for components of irregular shape, a new test

method has become necessary and such a test method is described in this International

Standard.

This International Standard describes the measurement of screening attenuation by the

reverberation chamber test method, sometimes named mode stirred chamber, suitable for

virtually any type of microwave component and having no theoretical upper frequency limit. It is

only limited toward low frequencies due to the size of the test equipment, which is frequency-

dependent and is only one of several methods of measuring screening attenuation.

For the purpose of this standard, examples of microwave components are waveguides, phase

shifters, diplexers/multiplexers, power dividers/combiners etc.
2 Normative references

The following documents, in whole or in part, are normatively referenced in this document and

are indispensable for its application. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments)

applies.

IEC 61196-1, Coaxial communication cables – Part 1: Generic specification – General,

definitions and requirements

IEC TS 62153-4-1, Metallic communication cable test methods – Part 4-1: Electromagnetic

compatibility (EMC) – Introduction to electromagnetic screening measurements

IEC 61000-4-21, Electromagnetic compatibility (EMC) – Part 4-21: Testing and measurement

techniques – Reverberation chamber test methods
3 Terms and definitions

For the purposes of this document, the terms and definitions given in IEC 61196-1 and

IEC 61000-4-21 apply.
4 Basic description of the reverberation chamber method
The reverberation chamber method for measurement of the screening attenuation of

microwave components consists of exposing the device under test (DUT) to an almost

homogeneous and isotropic electromagnetic field and then measuring the signal level induced

into the device.
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SIST EN 61726:2016
– 6 – IEC 61726:2015 © IEC 2015

These conditions are achieved by the use of a shielded enclosure, which acts as an oversized

cavity (in terms of wavelength), with a high quality factor. Its boundary conditions are

continuously agitated by a rotating reflective surface (mode stirrer), mounted within the

chamber, which enables the field to approach homogeneous and isotropic conditions during

one revolution.

Electromagnetic power is fed to the chamber by means of an input or transmitting antenna. The

strength of the field inside the chamber is measured through a reference antenna. The ratio of

the injected power (input antenna) to the received power (reference antenna) is the insertion

loss of the cavity. The insertion loss is strongly frequency dependent and is also dependent on

the quality factor of the cavity. More detailed explanation on the measurement facility can be

found in IEC 61000-4-21.

It has been shown that, due to the isotropic field, any antenna placed inside the cavity behaves

as if its gain was unity [2] , therefore no directional effect is to be expected. If the device under

test is electrically short, its screening attenuation will be directly related to usual transfer

parameters (Z and Z). If the device under test is not electrically short, the screening

t f

attenuation may still be related to Z and Z in some simple cases (evenly distributed leakage,

t f

periodically distributed leakage) using summing functions derived from antenna network theory.

5 Measurement of the screening attenuation of the device under test (DUT)

The measurement of screening attenuation is based on the comparison of the electromagnetic

field power outside the DUT to the electromagnetic field power induced into the DUT. The

screening attenuation is then defined as:
 P 
DUT
 
a =−10 log (1)
s 10
 
 REF 
 P 
DUT
  (2)
a =−10 log −D
s 10 ins
 
 INJ 
where
P is the power coupled to the device under test (W);
DUT
P is the power coupled to the reference antenna (W);
REF
P is the power injected into the chamber (W);
INJ
D is the insertion loss of the chamber in decibels (dB).
ins
6 Description of the test set-up
6.1 Reverberation chamber
The used reverberation chamber shall be compliant to IEC 61000-4-21.

In general, a reverberation chamber is a shielded enclosure having any shape. A perfect cubic

shape should be avoided for optimum performance at lower frequencies. It shall be made of

conduc
...

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