ISO/TC 201/SC 3 - Data management and treatment

This document is provided to assist in the surface analysis of thin films on materials which are not thought to contain carbon compounds as intended components but for which a C1s peak is observed in the survey spectrum. The films can be those generated on metals and alloys by aerobic or electrochemical oxidation or be those deposited on inert substrates. The procedure described is not suitable for discontinuous deposits of particles on a substrate. With this exception, a simple procedure is provided for identifying the C1s signal from carbon-containing surface contamination. When the C1s peak is identified as arising from an adventitious over-layer the composition derived from the survey spectrum can be corrected for its influence. Recommended procedures are provided in the form of simple Rules structured in the 'If - Then` format with the intention that the information they embody might be utilised by automated procedures in data-systems. The rules provided utilize only information retrieved from the XPS survey scan.

ISO 28600:2011 specifies a format for the transfer of scanning-probe microscopy (SPM) data from computer to computer via parallel interfaces or via serial interfaces over direct wire, local area network, global network or other communication links. The transferred data is encoded in those characters that appear on a normal computer display or printer. The format is designed for the data of SPM such as scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and related surface analytical methods using pointed probes scanned over sample surfaces. The format covers the data taken by single-channel imaging, multiple-channel imaging and single-point spectroscopy. The format can be expanded to two-dimensional spectroscopy mapping in a future version.

ISO 22048:2004 provides a digital format to store, and transfer between computers, in a compact way, important calibration and instrumental-parameter data necessary to make effective use of spectral-data files from static SIMS instruments. This format is designed to supplement the data transfer format specified in ISO 14976.

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.