Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de machine (MM)

Etablit une procédure normalisée pour les essais et les classements des dispositifs à semiconducteurs en fonction de leur sensibilité aux dommages ou à la dégradation du fait de leur exposition à une décharge électrostatique (DES) sur un modèle de machine (MM) défini. Elle peut être utilisée comme une méthode d'essai en variante à la méthode d'essai de DES sur le modèle du corps humain. L'objectif est de fournir des résultats d'essai de DES fiables et reproductibles de manière à ce que des classifications précises puissent être réalisées. Cette méthode d'essai est applicable à tous les dispositifs à semiconducteurs et elle est classée destructive.

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 27. del: Preskušanje občutljivosti na elektrostatične izpraznitve (ESD) - Model stroja (MM) (IEC 60749-27:2006)

Ta del standarda IEC 60749 določa standardni postopek za preskušanje in razvrščanje polprevodniških elementov glede na njihovo dovzetnost za poškodbe ali staranje, ko so izpostavljeni elektrostatični izpraznitvi (ESD) določenih modelov stroja (MM). Lahko se uporablja kot alternativna preskusna metoda za preskusno metodo modela elektrostatične izpraznitve človeškega telesa. Cilj je zagotovitev zanesljivih in ponovljivih preskusnih rezultatov elektrostatične izpraznitve, da se lahko opravijo pravilne opredelitve. Ta preskusna metoda se uporablja pri vseh polprevodniških elementih in je opredeljena kot destruktivna. Preskus elektrostatične izpraznitve elementov se izbere iz te metode, modela človeškega telesa (HBM – glej standard IEC 60749-26) ali druge testne metode v seriji standardov IEC 60749. S preskusnima metodama modelov stroja in metode človeškega telesa dobimo podobne, vendar ne enake rezultate. Če ni navedeno drugače, je treba izbrati preskusno metodo modela človeškega telesa.

General Information

Status
Published
Publication Date
24-Aug-2006
Withdrawal Date
31-Jul-2009
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available - Publishing
Start Date
25-Aug-2006
Completion Date
25-Aug-2006

Relations

Buy Standard

Standard
EN 60749-27:2007
English language
16 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)

SLOVENSKI SIST EN 60749-27:2007

STANDARD
januar 2007
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 27. del:
Preskušanje občutljivosti na elektrostatične izpraznitve (ESD) - Model stroja
(MM) (IEC 60749-27:2006)
(istoveten EN 60749-27:2006)
Semiconductor devices - Mechanical and climatic test methods - Part 27:
Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-
27:2006)
ICS 31.080.01 Referenčna številka
SIST EN 60749-27:2007(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

---------------------- Page: 1 ----------------------

EUROPEAN STANDARD
EN 60749-27

NORME EUROPÉENNE
August 2006
EUROPÄISCHE NORM

ICS 31.080.01


English version


Semiconductor devices -
Mechanical and climatic test methods
Part 27: Electrostatic discharge (ESD) sensitivity testing -
Machine model (MM)
(IEC 60749-27:2006)


Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 27: Essai de sensibilité aux Teil 27: Prüfung der Empfindlichkeit
décharges électrostatiques (DES) - gegen elektrostatische Entladungen
Modèle de machine (MM) (ESD) -
(CEI 60749-27:2006) Machine Model (MM)
(IEC 60749-27:2006)




This European Standard was approved by CENELEC on 2006-08-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-27:2006 E

---------------------- Page: 2 ----------------------

EN 60749-27:2006 - 2 -
Foreword
The text of document 47/1861/FDIS, future edition 2 of IEC 60749-27, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-27 on 2006-08-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-05-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-08-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-27:2006 was approved by CENELEC as a European
Standard without any modification.
__________

---------------------- Page: 3 ----------------------

- 3 - EN 60749-27:2006

Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

1) 2)
IEC 61340-3-2 - Electrostatics EN 61340-3-2 2002
Part 3-2: Methods for simulation of
electrostatic effects - Machine model (MM) -
Component testing


1) 2)
IEC 60749-26 - Semiconductor devices - Mechanical and EN 60749-26 2006
climatic test methods
Part 26: Electrostatic discharge (ESD)
sensitivity testing - Human body model (HBM)




1)
Undated reference.
2)
Valid edition at date of issue.

---------------------- Page: 4 ----------------------

NORME CEI
INTERNATIONALE
IEC



60749-27
INTERNATIONAL


Deuxième édition
STANDARD

Second edition

200
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.