IEC 60747-14-11:2021(E) defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This docume...view more

    • sale 15% off
    • Standard
      21 pages
      English language

IEC 62435-7:2020 on long-term storage applies to micro-electromechanical devices (MEMS) in long-term storage that can be used as part of obsolescence mitigation strategy. Long-term storage refers to a duration that may be more than 12 months for products scheduled for storage. Philosophy, good working practice, and general means to facilitate the successful long-term storage of electronic components are also addressed.

    • sale 10% off
    • Standard
      22 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60747 specifies the terminology, essential ratings, characteristics, safety test
and the measuring methods of magnetic coupler and capacitive coupler.
It specifies the principles and requirements of insulation and isolation characteristics for
magnetic and capacitive couplers for basic insulation and reinforced insulation.

    • sale 10% off
    • Standard
      55 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60749 provides a means of assessing the resistance to soldering heat of
semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is
destructive.

    • sale 10% off
    • Standard
      30 pages
      English language
    • e-Library read for
      1 day

The contents of the corrigendum of September 2020 have been included in this copy.

    • sale 10% off
    • Amendment
      9 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60749 describes a test used to determine whether encapsulated solid state
devices used for through-hole mounting can withstand the effects of the temperature to which
they are subjected during soldering of their leads by using wave soldering.
In order to establish a standard test procedure for the most reproducible methods, the solder
dip method is used because of its more controllable conditions. This procedure determines
whether devices are capable of withstanding the sol...
view more

    • sale 10% off
    • Standard
      12 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60749 establishes a standard procedure for determining the preconditioning
of non-hermetic surface mount devices (SMDs) prior to reliability testing.
The test method defines the preconditioning flow for non-hermetic solid-state SMDs
representative of a typical industry multiple solder reflow operation.
These SMDs are subjected to the appropriate preconditioning sequence described in this
document prior to being submitted to specific in-house reliability testing (qualificati...
view more

    • sale 10% off
    • Standard
      15 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60747 specifies the terminology, essential ratings, characteristics, safety
tests, as well as the measuring methods for photocouplers.
NOTE The term "optocoupler" can also be used instead of "photocoupler".

    • sale 10% off
    • Standard
      56 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60749 specifies the procedural requirements for performing valid endurance,
retention and cross-temperature tests based on a qualification specification. Endurance and
retention qualification specifications (for cycle counts, durations, temperatures, and sample
sizes) are specified in JESD47 or are developed using knowledge-based methods such as in
JESD94.

    • sale 10% off
    • Standard
      23 pages
      English language
    • e-Library read for
      1 day

This part of the IEC 62435 series on long-term storage is applied to passive electronic devices
in long-term storage that can be used as part of obsolescence mitigation strategy. Longterm
storage refers to a duration that can be more than 12 months for product scheduled for
storage. Storage typically begins when components are packed at the originating supplier
where the pack date or date code are assigned to the product. It is the responsibility of the
distributor and the customer to contr...
view more

    • sale 10% off
    • Standard
      20 pages
      English language
    • e-Library read for
      1 day

IEC 60749-20:2020 is available as IEC 60749-20:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-20:2020 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This edition includes the following significant technical changes with respect to the previous edition:
- inco...
view more

    • sale 15% off
    • Standard
      55 pages
      English and French language

IEC 60749-30:2020 is available as IEC 60749-30:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.
The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder...
view more

    • sale 15% off
    • Standard
      26 pages
      English and French language

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

    • sale 15% off
    • Standard
      44 pages
      English and French language

IEC 60747-5-5:2020(E) specifies the terminology, essential ratings, characteristics, safety tests, as well as the measuring methods for photocouplers.
Note: The term "optocoupler" can also be used instead of "photocoupler".
This edition includes the following significant technical changes with respect to the previous edition:
a) optional data sheet basic insulation rating in accordance with IEC 60664-1:2007, 6.1.3.5;
b) editorial corrections on the use of VIORM;
c) editorial corrections on ...
view more

    • sale 15% off
    • Standard
      52 pages
      English language

IEC 60749-15:2020 is available as IEC 60749-15:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 60749-15:2020 describes a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during soldering of their leads by using wave soldering. In order to establish a standard test proce...
view more

    • sale 15% off
    • Standard
      17 pages
      English and French language

This part of IEC 62435 describes the aspects of data storage that are necessary for
successful use of electronic components being stored after long periods while maintaining
traceability or chain of custody. It defines what sort of data needs to be stored alongside the
components or dies and the best way to do so in order to avoid losing data during the storage
period. As defined in this document, long-term storage refers to a duration that can be more
than twelve months for products schedu...
view more

    • sale 10% off
    • Standard
      15 pages
      English language
    • e-Library read for
      1 day

IEC 62933-5-2:2020 primarily describes safety aspects for people and, where appropriate, safety matters related to the surroundings and living beings for grid-connected energy storage systems where an electrochemical storage subsystem is used.

    • sale 15% off
    • Standard
      155 pages
      English and French language

IEC 60747-18-2:2020(E) specifies the evaluation process of lens-free CMOS photonic array sensor package modules. This document includes the measurement environment of each process, statistical analysis of test data, middle layer effect under various user light, evaluation of calibrated lens-free CMOS photonic array sensor package modules, and test report.

    • sale 15% off
    • Standard
      18 pages
      English language

IEC 62779-4:2020 defines general requirements on the electrical performances of a semiconductor interface for capsule endoscope using galvanic coupling human body communication. It includes general and functional specifications of the interface. The semiconductor interface that is covered in this document is the interface to handle or deliver an electrical signal between the capsule endoscope inside the human body and the HBC modem in the receiving device outside the human body.
NOTE Additional...
view more

    • sale 15% off
    • Standard
      37 pages
      English and French language

IEC 60747-9:2019 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).
This third edition includes the following significant technical changes with respect to the previous edition:  
reverse-blocking IGBT and its related technical contents have been added;
reverse-conducting IGBT and its related technical contents have been added;
some parts...
view more

    • sale 15% off
    • Standard
      160 pages
      English and French language

IEC 60747-14-10:2019 specifies the terms, definitions, symbols, tests, and performance evaluation methods used to determine the performance characteristics of wearable electrochemical-glucose sensors for practical use. This document is applicable to all wearable electrochemical-glucose sensors for consumers and manufacturers, without any limitations on device technology and size.

    • sale 15% off
    • Standard
      64 pages
      English and French language

IEC 63033-3:2019 specifies measurement methods for the drive monitoring system that is specified in IEC TS 63033-1:2017.

    • sale 15% off
    • Standard
      32 pages
      English and French language

This standard specifies the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit frequency multipliers.

    • sale 10% off
    • Standard
      28 pages
      English language
    • e-Library read for
      1 day

IEC 60749-20-1:2019 is available as IEC 60749-20-1:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 60749-20-1:2019 applies to all devices subjected to bulk solder reflow processes during PCB assembly, including plastic encapsulated packages, process sensitive devices, and other moisture-sensitive devices made with moisture-permeable materials (epoxies, silicones, etc.) that are exposed ...
view more

    • sale 15% off
    • Standard
      82 pages
      English and French language

IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This do...view more

    • sale 10% off
    • Standard
      23 pages
      English language
    • e-Library read for
      1 day

IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This do...view more

    • sale 10% off
    • Standard
      23 pages
      English language
    • e-Library read for
      1 day

The neutron irradiation test is performed to determine the susceptibility of semiconductor
devices to non-ionizing energy loss (NIEL) degradation. The test described herein is
applicable to integrated circuits and discrete semiconductor devices and is intended for
military- and aerospace-related applications. It is a destructive test.
The objectives of the test are as follows:
a) to detect and measure the degradation of critical semiconductor device parameters as
a function of neutron flue...
view more

    • sale 10% off
    • Standard
      11 pages
      English language
    • e-Library read for
      1 day

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, a...view more

    • sale 10% off
    • Standard
      11 pages
      English language
    • e-Library read for
      1 day

IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This do...view more

    • sale 15% off
    • Standard
      44 pages
      English and French language

IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:  
updates to better align the test method with MIL-STD 883J, method 1...
view more

    • sale 15% off
    • Standard
      17 pages
      English and French language

This part of IEC 62435 on long-term storage applies to packaged or finished devices in longterm
storage that can be used as part of obsolescence mitigation strategy. Long-term storage
refers to a duration that can be more than 12 months for product scheduled for storage. Philosophy,
good working practice, and general means to facilitate the successful long-term storage
of electronic components are also addressed.

    • sale 10% off
    • Standard
      19 pages
      English language
    • e-Library read for
      1 day

This part of IEC 62969 specifies a method of directly fault injection test for automotive
semiconductor sensor interface that can be used to support the conformance assurance in the
vehicle communications interface.

    • sale 10% off
    • Standard
      21 pages
      English language
    • e-Library read for
      1 day

This part of IEC 62435 specifies long-term storage methods and recommended conditions for
long-term storage of electronic components including logistics, controls and security related to
the storage facility. Long-term storage refers to a duration that may be more than 12 months
for products scheduled for long duration storage. The philosophy of such storage, good
working practices and general means to facilitate the successful long-term storage of
electronic components are also addressed.

    • sale 10% off
    • Standard
      23 pages
      English language
    • e-Library read for
      1 day

This part of IEC 62969 describes terms, definitions, symbols, configurations, and test
methods that can be used to evaluate and determine the performance characteristics of
mechanical shock driven piezoelectric energy harvesting devices for automotive vehicle
sensor applications.
This document is also applicable to energy harvesting devices for motorbikes, automobiles,
buses, trucks and their respective engineering subsystems applications without any limitations
of device technology and si...
view more

    • sale 10% off
    • Standard
      27 pages
      English language
    • e-Library read for
      1 day

This part of IEC 62969 specifies procedures and definitions for measuring the efficiency of the
wireless power transmission system for the automotive vehicles sensors. This document deals
with the power range below 500 mW.

    • sale 10% off
    • Standard
      13 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of
semiconductor devices to corrosion. It is an accelerated test that simulates the effects of
severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices
specified for a marine environment.
The salt atmosphere test is considered destructive.

    • sale 10% off
    • Standard
      17 pages
      English language
    • e-Library read for
      1 day

IEC 60974-9:2018 is also available as IEC 60974-9:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 60974-9:2018 is applicable to requirements for installation and instructions for use of equipment for arc welding and allied processes designed in accordance with safety requirements of IEC 60974-1, IEC 60974-6 or equivalent. This standard cancels and replaces the first edition published...
view more

    • sale 15% off
    • Standard
      58 pages
      English and French language

This part of IEC 60191 gives guidelines on the preparation of outline drawings of discrete
devices, including discrete surface-mounted semiconductor devices with lead count less than
8.
For the preparation of outline drawings of surface-mounted discrete devices with a lead count
higher or equal to 8, IEC 60191-6 should be referred to as well.
The primary object of these drawings is to indicate the space to be allowed for devices in
equipment, together with other dimensional characteristics...
view more

    • sale 10% off
    • Standard
      39 pages
      English language
    • e-Library read for
      1 day

This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying
components and microcircuits according to their susceptibility (sensitivity) to damage or
degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
The purpose of this document is to establish a test method that will replicate HBM failures and
provide reliable, repeatable HBM ESD test results from tester to tester, regardless of
component type. Repeatable data will allo...
view more

    • sale 10% off
    • Standard
      52 pages
      English language
    • e-Library read for
      1 day

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1...view more

    • sale 10% off
    • Standard
      17 pages
      English language
    • e-Library read for
      1 day

IEC 60191-1:2018(E) gives guidelines on the preparation of outline drawings of discrete devices, including discrete surface-mounted semiconductor devices with lead count less than 8. This edition includes the following significant technical changes with respect to the previous edition: a) the Scope has been extended to include surface-mounted semiconductor devices with a lead count less than 8; b) a definition of the term "stand-off" has been added; c) the methods for locating the datum have bee...view more

    • sale 10% off
    • Standard
      39 pages
      English language
    • e-Library read for
      1 day

Specifies a small-scale laboratory screening procedure for comparing the relative burning behaviour of vertically or horizontally oriented specimens made from plastic and other non-metallic materials, exposed to a small-flame ignition source of 50 W nominal power.  These test methods determine the linear burning rate and the afterflame/afterglow times, as well as the damaged length of specimens.  Applicable to solid and cellular materials that have an apparent density of not less than 250 kg/m3,...view more

    • sale 15% off
    • Standard
      29 pages
      English and French language

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration,
within the specified frequency range, on internal structural elements. This is a destructive test.
It is normally applicable to cavity-type packages.
NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document
JESD 22-B103.

    • sale 10% off
    • Standard
      9 pages
      English language
    • e-Library read for
      1 day

IEC 60749-26:2018 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate...view more

    • sale 10% off
    • Standard
      52 pages
      English language
    • e-Library read for
      1 day

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J...view more

    • sale 10% off
    • Standard
      9 pages
      English language
    • e-Library read for
      1 day