Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method

Describes the measurement of screening attenuation by the reverberation, or stirred, chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring sreening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.

Konfektionierte Kabel, Kabel, Steckverbinder und passive Mikrowellenbauteile - Messung der Schirmdämpfung mit dem Strahlungskammerverfahren

Câbles, cordons, connecteurs et composants hyperfréquence passifs - Mesure de l'atténuation d'écran par la méthode de la chambre réverbérante

Describes the measurement of screening attenuation by the reverberation, or stirred, chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring sreening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.

Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method (IEC 61726:1999)

General Information

Status
Withdrawn
Publication Date
23-Mar-2000
Withdrawal Date
31-Dec-2002
Drafting Committee
Parallel Committee
Current Stage
9960 - Withdrawal effective - Withdrawal
Start Date
13-Oct-2018
Completion Date
13-Oct-2018

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SLOVENSKI SIST EN 61726:2004

STANDARD
april 2004
Cable assemblies, cables, connectors and passive microwave components -
Screening attenuation measurement by the reverberation chamber method (IEC
61726:1999)
ICS 33.120.10; 33.120.30 Referenčna številka
SIST EN 61726:2004(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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NORME CEI
INTERNATIONALE IEC
61726
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
1999-11
Câbles, cordons, connecteurs
et composants hyperfréquence passifs –
Mesure de l'atténuation d'écran
par la méthode de la chambre réverbérante
Cable assemblies, cables, connectors and
passive microwave components –
Screening attenuation measurement by the
reverberation chamber method
© IEC 2001 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun procédé, any form or by any means, electronic or mechanical,
électronique ou mécanique, y compris la photocopie et les including photocopying and microfilm, without permission in
microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
S
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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61726 © IEC:2001 – 3 –
CONTENTS
Page
FOREWORD . 5
INTRODUCTION .9
Clause
1 Scope . 11
2 Basic description of the reverberation chamber method . 11
3 Measurement of the screening attenuation of the device under test (DUT) . 13
4 Description of the test set-up. 13
4.1 Reverberation chamber . 13
4.2 Mode stirrer . 13
4.3 Antennas . 13
4.4 Test equipment . 15
4.5 Device under test (DUT). 17
4.6 Linking devices . 17
5 Measurement procedure. 19
5.1 General. 19
5.2 Measurement of the DUT . 19
5.3 Measurement of the insertion loss of the cavity. 19
5.4 Control of the test set-up. 21
5.5 Revolution speed of the mode stirrer . 23
5.6 Test frequencies . 23
5.7 Voltage standing wave ratio (VSWR) . 23
6 Evaluation of the test results . 23
6.1 Screening attenuation . 23
6.2 Relationship between transfer impedance parameters and screening attenuation. 25
6.3 Electromagnetic field surrounding the DUT . 27
Annex A (informative) Design of the reverberation chamber . 29
Annex B (informative) Design of the mode stirrer . 31
Annex C (informative) Example of a calibrator.
...

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